145nm Pitch Calibration Standard for AFM
Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements.
Period: 145nm pitch nominal, one dimensional array. Accuracy is +/- 1nm. Calibration certificate will give
the actual pitch of the standard.
Surface structure: Aluminum lines on glass, 4x6mm dimensions. Line height (about 100nm) and line width
(about 75nm) are not calibrated.
Usability: The calibrated pattern covers the entire standard. There is sufficient usable area to make tens of
thousands of measurements without reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from 250nm to 10um. Available unmounted or mounted
on a 12mm steel AFM disk.
Certification: Comes with a non-traceable manufacturer's certificate stating average pitch, based on batch measurements.
Sample Certificate for 145nm Pitch Calibration Standard
| Prod #
| Description
| Unit
| Price
| Order / Quote
|
| 145nm AFM Reference Standard, Certified, Non-traceable, Mounted on disk:
|
| 642-1AFM
| 145nm Very High Resolution AFM Reference Standard on 12mm steel disk
| each
| $986.00
|
|
| 145nm AFM Reference Standard, Certified, Non-traceable, Unmounted:
|
| 642-1
| 145nm Very High Resolution AFM Reference Standard, Unmounted
| each
| 835.00
|
|
292nm Pitch High Magnification, High Resolution
Calibration Standard for AFM, SEM, Auger and FIB.
Precision holographic grating standard with high contrast and excellent edge definition.
Period: 292nm pitch nominal, one dimensional array. Accuracy is +/- 1%.
Calibration certificate will give the actual pitch of the standard.
Surface structure: Titanium lines on Silicon, 4x3mm dimensions.
Line height (about 30nm) and line width (130nm) are not calibrated.
Usability: The calibrated pattern covers the entire chip.
There is sufficient usable area to make tens of thousands of measurements
without reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from
500nm to 20um. Mounted on a 12mm steel AFM disk.
SEM, Auger, FIB: Can be used for a wide range of accelerating voltage
(<1kV-30kV) and calibrates images from 5kX to 200kX. Can be supplied unmounted or
mounted on an SEM stub of your choice.
Certification: There is a version with a non-traceable manufacturer's
certificate stating average pitch, based on batch measurements;
See Sample Certificate, Non-Traceable
There is also the traceable, certified version measured in comparison with
a standard calibrated at PTB (Physiklisch-Technischen Bundesanstalt in Braunschweig,
Germany, is the German counterpart of NIST). The standard is NIST traceable by virtue
of the mutual recognition agreement by NIST and PTB.
See Mount Selections A-R
| Prod #
| Description
| Unit
| Price
| Order / Quote
|
| 292nm AFM Reference Standard, Certified, Non-traceable, Mounted on disk:
|
| 643-1AFM
| 292nm High Resolution AFM Reference Standard on 12mm steel disk
| each
| $1592.85
|
|
| 292nm SEM, Auger and FIB Reference Standard, Certified, Non-traceable
|
| 643-1
| 292nm High Resolution AFM Reference Standard, Unmounted
| each
| 1517.00
|
|
| 643-1A
| 292nm High Resolution AFM Reference Standard, Mount A
| each
| 1592.85
|
|
| 643-1B
| 292nm High Resolution AFM Reference Standard, Mount B
| each
| 1592.85
|
|
| 643-1C
| 292nm High Resolution AFM Reference Standard, Mount C
| each
| 1592.85
|
|
| 643-1D
| 292nm High Resolution AFM Reference Standard, Mount D
| each
| 1592.85
|
|
| 643-1E
| 292nm High Resolution AFM Reference Standard, Mount E
| each
| 1592.85
|
|
| 643-1F
| 292nm High Resolution AFM Reference Standard, Mount F
| each
| 1592.85
|
|
| 643-1G
| 292nm High Resolution AFM Reference Standard, Mount G, you supply mount
| each
| 1615.00
|
|
| 643-1K
| 292nm High Resolution AFM Reference Standard, Mount K
| each
| 1592.85
|
|
| 643-1L
| 292nm High Resolution AFM Reference Standard, Mount L
| each
| 1592.85
|
|
| 643-1M
| 292nm High Resolution AFM Reference Standard, Mount M
| each
| 1592.85
|
|
| 643-1O
| 292nm High Resolution AFM Reference Standard, Mount O
| each
| 1592.85
|
|
| 643-1P
| 292nm High Resolution AFM Reference Standard, Mount P
| each
| 1592.85
|
|
| 643-1Q
| 292nm High Resolution AFM Reference Standard, Mount Q
| each
| 1592.85
|
|
| 643-1R
| 292nm High Resolution AFM Reference Standard, Mount R
| each
| 1592.85
|
|
| 292nm AFM Reference Standard, Certified, Traceable, Mounted on disk:
|
| 643-11AFM
| 292nm High Resolution AFM Reference Standard on 12mm steel disk
| each
| P.O.R.
|
|
| 292nm SEM, Auger and FIB Reference Standard, Certified, Traceable
|
| 643-11
| 292nm High Resolution AFM Reference Standard, Traceable, Unmounted
| each
| P.O.R.
|
|
| 643-11A
| 292nm High Resolution AFM Reference Standard, Traceable, Mount A
| each
| P.O.R.
|
|
| 643-11B
| 292nm High Resolution AFM Reference Standard, Traceable, Mount B
| each
| P.O.R.
|
|
| 643-11C
| 292nm High Resolution AFM Reference Standard, Traceable, Mount C
| each
| P.O.R.
|
|
| 643-11D
| 292nm High Resolution AFM Reference Standard, Traceable, Mount D
| each
| P.O.R.
|
|
| 643-11E
| 292nm High Resolution AFM Reference Standard, Traceable, Mount E
| each
| P.O.R.
|
|
| 643-11F
| 292nm High Resolution AFM Reference Standard, Traceable, Mount F
| each
| P.O.R.
|
|
| 643-11G
| 292nm High Resolution AFM Reference Standard, Traceable, Mount G, you supply mount
| each
| P.O.R.
|
|
| 643-11K
| 292nm High Resolution AFM Reference Standard, Traceable, Mount K
| each
| P.O.R.
|
|
| 643-11L
| 292nm High Resolution AFM Reference Standard, Traceable, Mount L
| each
| P.O.R.
|
|
| 643-11M
| 292nm High Resolution AFM Reference Standard, Traceable, Mount M
| each
| P.O.R.
|
|
| 643-11O
| 292nm High Resolution AFM Reference Standard, Traceable, Mount O
| each
| P.O.R.
|
|
| 643-11P
| 292nm High Resolution AFM Reference Standard, Traceable, Mount P
| each
| P.O.R.
|
|
| 643-11Q
| 292nm High Resolution AFM Reference Standard, Traceable, Mount Q
| each
| P.O.R.
|
|
| 643-11R
| 292nm High Resolution AFM Reference Standard, Traceable, Mount R
| each
| P.O.R.
|
|
|