X-Ray References
Calibration for Scanning Electron Microscopy

#602

PELCO X-CHECKER™

Monitor Energy Dispersive Spectrometer/SEM Systems

PELCO X-Checker™ is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. PELCO X-Checker™ contains a series of standard materials on your choice of aluminum mount. With PELCO X-Checker™, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software. When was the last time you checked the performance of your EDS system?

The #602 and #602-A contain:

• Manganese to measure full width at half max (FWHM) detector resolution
• Aluminum and copper to check spectral calibration
• Carbon to monitor calibration at the low end of the spectrum for thin window detectors.
• Nickel TEM grid sizes, 40 x 40µm and 18 x 18µm, with ±5% accuracy, are furnished for checking image analysis software calibration. They also facilitate an easy test for monitoring the amount of vacuum pump oil contamination on the detector window

Instruction booklet and storage case included.

#602-2

PELCO X-CHECKER™ B

The addition of boron nitride to the PELCO X-Checker™ B, #602-2 and #602-2A provides a more sensitive monitor of low end performance on thin window and windowless detectors.

PELCO X-CHECKER™ EXTRA