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Calibration Overview
UHV-EL Reference Elements

X-Ray References
Calibration for Scanning Electron Microscopy

New improved PELCO X-Checker®
available unmounted or on your choice of A-R mounts.

PELCO X-Checker® | PELCO X-Checker® B | PELCO X-Checker® EXTRA | PELCO X-Checker® Wafer


x-checker for scanning electron microscopy

PELCO X-Checker®

Monitor Energy Dispersive Spectrometer/SEM Systems

The updated PELCO X-Checker® is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. The PELCO X-Checker® contains a series of standard materials on your choice of aluminum mount. With PELCO X-Checker®, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software. When was the last time you checked the performance of your EDS system?

The #602-01 contains:

  • Manganese to measure full width at half max (FWHM) detector resolution
  • Aluminum and copper to check spectral calibration
  • Carbon to monitor calibration at the low end of the spectrum for thin window detectors.
  • Nickel TEM grid sizes, 40 x 40µm and 18 x 18µm, with ±5% accuracy, are furnished for checking image analysis software calibration. They also facilitate an easy test for monitoring the amount of vacuum pump oil contamination on the detector window

Instruction booklet and storage case included.

PELCO® Technical Notes, PELCO X-Checker® (710KB PDF)

See mount selections, types A-R

Prod # Description Unit Price Order / Quote
602-01 PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, Unmounted each $600.00
Qty:
602-01A PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, A-Mount each 609.50
Qty:
602-01B PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, B-Mount each 609.50
Qty:
602-01C PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, C-Mount each 609.50
Qty:
602-01D PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, D-Mount each 609.50
Qty:
602-01E PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, E-Mount each 609.50
Qty:
602-01F PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, F-Mount each 609.50
Qty:
602-01G PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, Customer Supplies Mount each P.O.R.
Qty:
602-01K PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, K-Mount each 609.50
Qty:
602-01L PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, L-Mount each 609.50
Qty:
602-01M PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, M-Mount each 609.50
Qty:
602-01O PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, O-Mount each 609.50
Qty:
602-01P PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, P-Mount each 609.50
Qty:
602-01Q PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, Q-Mount each 609.50
Qty:
602-01R PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, R-Mount each 609.50
Qty:
602-01AFM PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, AFM-Mount each 609.50
Qty:
602-01S PELCO X-Checker®: Mn, Cu, C, 400 and 1000 mesh Ni grids, S-Mount each 609.50
Qty:




x-checker for scanning electron microscopy

PELCO X-Checker® B

The addition of a boron nitride sample to the PELCO X-Checker® B, #602-02 provides a more sensitive monitor of low end performance on thin window and windowless detectors.

Instruction booklet and storage case included.

PELCO® Technical Notes, PELCO X-Checker® (710KB PDF)

See mount selections, types A-R

Prod # Description Unit Price Order / Quote
602-02 PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, Unmounted each $700.00
Qty:
602-02A PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, A-Mount each 709.50
Qty:
602-02B PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, B-Mount each 709.50
Qty:
602-02C PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, C-Mount each 709.50
Qty:
602-02D PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, D-Mount each 709.50
Qty:
602-02E PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, E-Mount each 709.50
Qty:
602-02F PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, F-Mount each 709.50
Qty:
602-02G PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, Customer Supplies Mount each P.O.R.
Qty:
602-02K PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, K-Mount each 709.50
Qty:
602-02L PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, L-Mount each 709.50
Qty:
602-02M PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, M-Mount each 709.50
Qty:
602-02O PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, O-Mount each 709.50
Qty:
602-02P PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, P-Mount each 709.50
Qty:
602-02Q PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, Q-Mount each 709.50
Qty:
602-02R PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, R-Mount each 709.50
Qty:
602-02AFM PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, AFM-Mount each 709.50
Qty:
602-02S PELCO X-Checker® B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, S-Mount each 709.50
Qty:




x-checker for scanning electron microscopy

PELCO X-Checker® EXTRA

EDS performance monitor contains the same elements as the #602-03 plus a fluorine source, in the form of PTFE, to test resolution at the fluorine K-alpha peak (industry standard for measuring low end resolution). A beryllium half grid is also added for ultimate test of low end detector performance.

Instruction booklet and storage case included.

PELCO® Technical Notes, PELCO X-Checker® (710KB PDF)
MSDS (134KB PDF)

See mount selections, types A-R

Prod # Description Unit Price Order / Quote
602-03 PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, Unmounted each $800.00
Qty:
602-03A PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, A-Mount each 809.50
Qty:
602-03B PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, B-Mount each 809.50
Qty:
602-03C PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, C-Mount each 809.50
Qty:
602-03D PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, D-Mount each 809.50
Qty:
602-03E PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, E-Mount each 809.50
Qty:
602-03F PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, F-Mount each 809.50
Qty:
602-03G PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, Customer Supplies Mount each P.O.R.
Qty:
602-03K PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, K-Mount each 809.50
Qty:
602-03L PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, L-Mount each 809.50
Qty:
602-03M PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, M-Mount each 809.50
Qty:
602-03O PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, O-Mount each 809.50
Qty:
602-03P PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, P-Mount each 809.50
Qty:
602-03Q PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, Q-Mount each 809.50
Qty:
602-03R PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, R-Mount each 809.50
Qty:
602-03AFM PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, AFM-Mount each 809.50
Qty:
602-03S PELCO X-Checker® EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and Be half grid, S-Mount each 809.50
Qty:





x-checker wafer

PELCO X-Checker® Wafer

The PELCO X-Checker® Wafer is available for systems set up for silicon wafer handling. The PELCO X-Checker® Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations.

The #602-20 and #602-21 contain:

  • Copper disc to check spectral calibration
  • Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution
  • Nickel 400 mesh TEM grid for imaging calibration
  • PTFE as a fluorine source to measure low energy resolution
  • Carbon to monitor calibration at the low end of the spectrum for thin window detectors
  • Aluminum foil disc
  • Boron nitride to test low energy performance/peak separation
  • 304 stainless steel for checking quantification

Instruction booklet and clamshell wafer storage case included.

PELCO® Technical Notes, PELCO X-Checker® (710KB PDF)

Prod # Description Unit Price Order / Quote
602-20 PELCO X-Checker® Wafer, 200mm (8") each $1600.00
Qty:
602-21 PELCO X-Checker® Wafer, 300mm (12") each 2000.00
Qty: