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PELCO X-CHECKER | PELCO X-CHECKER B | PELCO X-CHECKER EXTRA | NEW PELCO X-CHECKER Wafer
#602
#602-A
Monitor Energy Dispersive Spectrometer/SEM Systems PELCO X-Checker is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. PELCO X-Checker contains a series of standard materials on your choice of aluminum mount. With PELCO X-Checker, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software. When was the last time you checked the performance of your EDS system? The #602 and #602-A contain:
Instruction booklet and storage case included.
#602-2
#602-2A
The addition of boron nitride to the PELCO X-Checkerâ„¢ B, #602-2 and #602-2A provides a more sensitive monitor of low end performance on thin window and windowless detectors.
#602-3A
The PELCO X-Checkerâ„¢ Wafer is available for systems set up for silicon wafer handling. The PELCO X-Checkerâ„¢ Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations.
The #602-20 and #602-21 contain:
Instruction booklet and clamshell wafer storage case included.