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Calibration Overview
UHV-EL Reference Elements

X-Ray References
Calibration for Scanning Electron Microscopy

PELCO X-CHECKER™ | PELCO X-CHECKER™ B | PELCO X-CHECKER™ EXTRA | NEW PELCO X-CHECKER™ Wafer


x-checker for scanning electron microscopy
#602

x-checker for scanning electron microscopy
#602-A

PELCO X-CHECKER™

Monitor Energy Dispersive Spectrometer/SEM Systems

PELCO X-Checker™ is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. PELCO X-Checker™ contains a series of standard materials on your choice of aluminum mount. With PELCO X-Checker™, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software. When was the last time you checked the performance of your EDS system?

The #602 and #602-A contain:

  • Manganese to measure full width at half max (FWHM) detector resolution
  • Aluminum and copper to check spectral calibration
  • Carbon to monitor calibration at the low end of the spectrum for thin window detectors.
  • Nickel TEM grid sizes, 40 x 40µm and 18 x 18µm, with ±5% accuracy, are furnished for checking image analysis software calibration. They also facilitate an easy test for monitoring the amount of vacuum pump oil contamination on the detector window

Instruction booklet and storage case included.

16150 drawing 16150
16150

Prod # Description Unit Price Order / Quote
602 PELCO X-CHECKER™: Mn, Cu, C, 400 and 1000 mesh Ni grids, on a JEOL ø25 x 5mm cylinder mount each $600.00
Qty:
dimensions 1 sem pin mount
16111

Prod # Description Unit Price Order / Quote
602-A PELCO X-CHECKER™: Mn, Cu, C, 400 and 1000 mesh Ni grids, on an FEI/Tescan/ZEISS ø12.7mm Al stub each $600.00
Qty:




x-checker for scanning electron microscopy
#602-2

x-checker for scanning electron microscopy
#602-2A

PELCO X-CHECKER™ B

The addition of boron nitride to the PELCO X-Checkerâ„¢ B, #602-2 and #602-2A provides a more sensitive monitor of low end performance on thin window and windowless detectors.

16150 drawing 16150
16150

Prod # Description Unit Price Order / Quote
602-2 PELCO X-CHECKER™ B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, on a JEOL ø25 x 5mm cylinder mount each $700.00
Qty:
dimensions 1 sem pin mount
16111

Prod # Description Unit Price Order / Quote
602-2A PELCO X-CHECKER™ B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, on an FEI/Tescan/ZEISS ø12.7mm Al stub each $700.00
Qty:




x-checker for scanning electron microscopy
#602-3

x-checker for scanning electron microscopy
#602-3A

PELCO X-CHECKER™ EXTRA

EDS performance monitor contains the same elements as the #602-2 and #602-2A plus a fluorine source to test resolution at the fluorine K-alpha peak (industry standard for measuring low end resolution). A beryllium half grid is also added for ultimate test of low end detector performance.

MSDS (134KB PDF)
16150 drawing 16150
16150

Prod # Description Unit Price Order / Quote
602-3 PELCO X-CHECKER™ EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and 1,000 mesh Be grid, on a JEOL ø25 x 5mm cylinder mount each $800.00
Qty:
dimensions 1 sem pin mount
16111

Prod # Description Unit Price Order / Quote
602-3A PELCO X-CHECKER™ EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and 1,000 mesh Be grid, on an FEI/Tescan/ZEISS ø12.7mm Al stub each $800.00
Qty:





x-checker wafer

NEW PELCO X-CHECKER™ Wafer

The PELCO X-Checkerâ„¢ Wafer is available for systems set up for silicon wafer handling. The PELCO X-Checkerâ„¢ Wafer is available on standard 200mm (8") and 300mm (12") wafers, with eight standards for elemental and spatial calibrations.

The #602-20 and #602-21 contain:

  • Copper disc to check spectral calibration
  • Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution
  • Nickel 400 mesh TEM grid for imaging calibration
  • PTFE as a fluorine source to measure low energy resolution
  • Carbon to monitor calibration at the low end of the spectrum for thin window detectors
  • Aluminum foil disc
  • Boron nitride to test low energy performance/peak separation
  • 304 stainless steel for checking quantification

Instruction booklet and clamshell wafer storage case included.

Prod # Description Unit Price Order / Quote
602-20 PELCO X-Checker™ Wafer, 200mm (8") each $1600.00
Qty:
602-21 PELCO X-Checker™ Wafer, 300mm (12") each 2000.00
Qty: