Calibration Overview

Microscope Calibration Target

For SEM, FIB, AFM and Light Microscopy
MetroChip Calibration Standard or Target
Note: Click on Micrographs below to See Area Enlargement

The MetroChip Microscope Calibration Standard for SEM, FIB, AFM, Light Microscopy and Metrology Systems provides an extensive range of targets with periodic features for enhanced calibration down to the 100nm range. The MetroChip standard is produced with today's nanotechnology demands in mind. It is designed for a long life use and presents a stable calibration platform. The standard is produced on a 20x20mm chip with a thickness of 750µm. It delivers high contrast images for analytical SEM with minimal charging and combines a huge calibration range from 4mm down to 100nm. Calibration target for SEM features include alignment marks, linear microscale, distortion measurements, par-axial calibration (image shift), resolution measurements, focus star, stigmator calibration, gratings, concentric circles and squares. The combination of these targets on one standard makes the MetroChip ideal as an all-in-one standard for setting up and regular calibration checks of the SEM, FIB or FESEM. It is also employed for Light Microscopy and AFM; there are a number of targets to check linearity, distortion and scan length.

The Microscope MetroChip Calibration Target is fully traceable to NIST Certification:
Certification: Traceability of Sample Pitch (pdf)
Report of Calibration NIST Test No. 821/271639-05 (pdf)

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Metrochip Chip Cleaning Procedure (PDF 70KB)

MetroChip Product Description Guide (PDF 2.9MB)

Prod # Description Unit Price Order / Quote
632 MetroChip Microscope Calibration Target each $750.00