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Calibration Overview
TEM Calibration
Scanning Electron Microscopy Calibration
Magnification
|
EDS/WDS/EPMA/XPS
|
Resolution
|
Performance Testing
Magnification and FIB Standards
MetroChip Microscope Calibration Target for SEM/AFM/SPM
Pelcotec™ CDMS Critical Dimension Magnification Standards
Pelcotec™ G-1 Silicon
Calibration Specimen
1µm Pitch
Pelcotec™ LMS-20
Low Magnification
Calibration Standard
MRS-6 Magnification Reference Standard
1,500X to 1,000,000X
Critical Dimension (CD) Calibration Test Specimen for SEM/FIB/AFM
2D Holographic Array Very High Resolution Calibration Standards for SEM, FIB, AFM and Auger
Low Magnification
Calibration Ruler
MRS-4 Magnification Reference Standard
10X to 200,000X
Planotec 10µm Pitch Silicon
Calibration Specimen
292nm Pitch High Magnification Calibration Standard for SEM, FIB, AFM, Auger
500nm Cross Line
Grating Replica
MRS-3 Magnification Reference Standard
10X to 50,000X
Planotec 10µm Pitch Silicon
Calibration Specimen
145nm Pitch High Magnification Calibration Standard for SEM, FIB, AFM, Auger
Fine Copper Mesh Grid Low Magnification Standard
X-Ray Microanalysis Standards (EDS/WDS/EPMA/XPS)
UHV-EL Reference
Standards for EDS/WDS
PELCO® XCS EDS Calibration Standards
X-CHECKER™ X-Ray Reference Calibration for SEM
PELCO® Faraday Cup
PELCO® NiOx Test Specimen for Analytical Electron Microscopy (AEM)
Planotec GSR & Particle Analysis Calibration Kit
Resolution Standards
AuSome™ Resolution Standard for SEM, FIB and FESEM
Gold on Carbon
High Resolution Test Specimens
Tin on Carbon Resolution Test Specimens
Low Magnifcation Resolution Test Specimens
Performance Testing
Back Scattered Electron Test Specimens
JN-1 SEM Demonstration Specimens
PELCO® Astigmatism Corrector
USA / Canada
: Telephone: 530-243-2200; 800-237-3526; Fax 530-243-3761; Email:
[email protected]
International
: Telephone: 530-243-2200; Fax 530-243-3761; Email:
[email protected]
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