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Cantilever Tweezers

Budget Sensors Atomic Force Microscopy Probes

Atomic Force Microscopy AFM probe micrograph The right choice of AFM probes is extremely important for the quality of your AFM work. The BudgetSensors AFM probes are an excellent choice for today’s high demands in nanotech research. Designed by specialists in AFM, they combine the latest technology of AFM tip/cantilever manufacturing with a realistic pricing. Made of monolithic silicon, they fit into most commercially available AFM’s (DI nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec, etc) and outperform all other silicon AFM probes on the market when it comes to value, sharpness, symmetry and consistency. The BudgetSensors AFM probes are specifically designed for different AFM modes and are available with a variety of coatings to give the highest resolution needed for cutting edge nanoscale imaging.
If there are any doubts regarding compatibility of your AFM system with the BudgetSensors AFM probes, please contact us at sales@tedpella.com.

The silicon AFM probes products are:

  • Tap300 series for tapping mode
  • Tap150G series for soft tapping mode
  • Tap190G series with longer canilever for soft tapping mode (Quesant AFM Systems)
  • Multi75 series for force modulation mode
  • Contact series for contact mode and pulse force mode
  • Magnetic AFM Probe, an excellent choice for MFM applications
Some AFM systems, such as NanoScale, require alignment grooves on the back side of the AFM holder chip for correct holding and calibration of each AFM probe. All products with alignment grooves have "-G-" in their product number.
Available AFM Probes with alignment grooves are:
  1. Tap150-G
  2. Tap190-G
  3. NEW! Multi75Al-G; Multi75E-G; Multi75M-G
  4. NEW! ContAl-G

Please Note: The presence of the alignment Grooves does not affect the AFM probe in systems that do not require this feature. AFM probes with grooves have the same specifications and pricing as the equivalent probes without alignment grooves.

Budget Sensors TipChecker, an SPM sample for fast, convenient and efficient determination of the AFM tip condition.

NEW! HS-20MG and HS-100MG. Two new cost effective AFM calibration standard to calibrate your AFM system. Step height of 20 and 100nm are available together with X- and Y -direction feature calibration.

AFM probes are all available with some or all of the following high quality coatings (depending on series):
  • Al -    Aluminium coating of the cantilever for enhanced reflectivity
  • Electri - Chromium/Platinum electrically conductive coating for Electric Modes
  • GD -  Partial gold coating of the cantilever for enhanced reflectivity for special applications like in liquids
  • GB -  Overall gold coating of the cantilever where the probe acts as an electrode
  • M - Magnetic Coating
  • DLC - Diamond-Like-Coating on tip side of cantilever.

NEW! DLC Diamond-Like-Coatings for the Tapping, Force Modulation and Contact Mode AFM probes providing a hard coating on the tip side of the cantilever. The hard DLC coating offers high durability, reduced tip wear and increased tip life. At the same time, the DLC coating is so thin that the tip radius is still less than 15nm. The DLC coating is not electrically conductive. All DLC coated AFM tips have an aluminum reflex coating on the back side of the cantilever and alignment grooves on the holder chip.


Overview of Budget Sensors Si AFM Tips and Available Coatings

Tapping mode
TAP 300
Soft tapping mode
TAP 150
Soft tapping mode
TAP 190
Coatings:
Coatings:
Coatings:
Force modulation mode
MULTI 75
MFM application
Magnetic Multi
Contact mode
CONTACT
Coatings:
Coatings: Coatings:

 

For soft contact mode BudgetSensor has developed twintip
SiNi Silicon Nitride AFM Probes

 


Order a combination of whatever probes you want. BudgetComboBox gives you the freedom to choose freely your personalized box with AFM probes out of any available BudgetSensors AFM Probe models you need.


Technical information and dimensions for the BudgetSensor AFM holder, cantilever and tip:

AFM Holder Chip

afm holder chip

The AFM Holder Chip fits most commercial AFM's as it has industry standard size. It is compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFM's

AFM Cantilever

afm cantilever atomic force microscopy

The AFM Cantilever is micromachined monolithic Silicon, comprising excellent uniformity. It provides high quality imaging for all standard AFM's.

AFM Tip

atomic force microscopy tip

The AFM Tip is a micromachined monolithic Silicon probe, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 10nm gives good resolution and reproducibility. The probes (except the Silicon Nitride tip) feature an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.


or go to BudgetComboBox for a mixed box of probes

Silicon AFM Probes

Model >>> Tap300 / Tap300AL / Tap300GD / Tap300GB / ElectriTap300 / Tap300DLC
Technical Data:
  Value Range
Resonant Freq. 300 kHz +/-100 kHz
Force Constant 40 N/m 20 - 75 N/m
Length 125 µm +/-10 µm
Mean Width 30 µm +/-5 µm
Thickness 4 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Tap 300; 300AL; 300GD)
<25nm (Electri-Tap 300)
<15nm (Tap300DLC)
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
Silicon AFM Probe, Tap300 drawing
Tap300
Application: Tapping, Intermittent Contact
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: None
Tap 300 Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP300-10
Silicon AFM Probes, Tap 300, no coating
pkg/10
$200.00
Qty:
TAP300-50
Silicon AFM Probes, Tap 300, no coating
pkg/50
850.00
Qty:
TAP300-W
Silicon AFM Probes, Tap 300, no coating
pkg/380
P.O.R.
Qty:

Tap300AL
Application: Tapping, Intermittent Contact
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: 30nm Al for enhanced reflectivity
Tap 300 Al Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP300AL-10
Silicon AFM Probes, Tap 300 Al, Aluminum Reflex Coating
pkg/10
$210.00
Qty:
TAP300AL-50
Silicon AFM Probes, Tap 300 Al, Aluminum Reflex Coating
pkg/50
890.00
Qty:
TAP300AL-W
Silicon AFM Probes, Tap 300 Al, Aluminum Reflex Coating
pkg/380
P.O.R.
Qty:

Tap300GD
Application: Non-contact, Tapping
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on back of cantilever
Tap 300 GD Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP300GD-10
Silicon AFM Probes, Tap 300 GD, part Au coating
pkg/10
$240.00
Qty:
TAP300GD-50
Silicon AFM Probes, Tap 300 GD, part Au coating
pkg/50
1,000.00
Qty:

Tap300GB
Application: Non-contact, Tapping, special application
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on both sides of cantilever
Tap 300 GB Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP300GB-10
Silicon AFM Probes, Tap 300 GB, overall Au coating
pkg/10
$240.00
Qty:
TAP300GB-50
Silicon AFM Probes, Tap 300 GB, overall Au coating
pkg/50
1,000.00
Qty:

ElectriTap300
Application: Tapping, Intermittent Contact Mode and Electric Modes like:
• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KFM)
• Scanning Probe Lithography
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.
ElectriTap 300 Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP300E-10
Silicon AFM Probes, ElectriTap 300, overall Cr/Pt Coating
pkg/10
$240.00
Qty:
TAP300E-50
Silicon AFM Probes, ElectriTap 300, overall Cr/Pt Coating
pkg/50
1,000.00
Qty:

TAP300DLC
Application: Tapping, Intermittent Contact Mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.
TAP300DLC Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP300DLC-10
Silicon AFM Probes, Tap 300 DLC, DLC coating on tip
pkg/10
$240.00
Qty:
TAP300DLC-50
Silicon AFM Probes, Tap 300 DLC, DLC coating on tip
pkg/50
1,000.00
Qty:


go to BudgetComboBox for a mixed box of probes

Model >>> Tap150-G / Tap150AL-G / Tap150DLC
Technical Data:
  Value Range
Resonant Freq. 150 kHz +/-75 kHz
Force Constant 5 N/m 1.5 - 15 N/m
Length 125 µm +/-10 µm
Mean Width 25 µm +/-5 µm
Thickness 2.1 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Tap150-G, Tap150AL-G)
<15 nm (Tap150DLC)
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
Tap150-G AFM probe drawing
Tap150-G
Application: Soft tapping mode, intermittent contact mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: None
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
Tap 150-G Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP150-G-10
Silicon AFM Probes, Tap 150, no coating
pkg/10
$200.00
Qty:
TAP150-G-50
Silicon AFM Probes, Tap 150, no coating
pkg/50
850.00
Qty:

Tap150AL-G
Application: Soft tapping mode, intermittent contact mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Aluminum Reflex coating, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
Tap 150Al-G Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP150AL-G-10
Silicon AFM Probes, Tap 150 Al, aluminum reflex coating
pkg/10
$210.00
Qty:
TAP150AL-G-50
Silicon AFM Probes, Tap 150 Al, aluminum reflex coating
pkg/50
890.00
Qty:

TAP150DLC
Application: Tapping, Intermittent Contact Mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.
TAP150DLC Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP150DLC-10
Silicon AFM Probes, Tap 300 DLC, DLC coating on tip
pkg/10
$240.00
Qty:
TAP150DLC-50
Silicon AFM Probes, Tap 300 DLC, DLC coating on tip
pkg/50
1,000.00
Qty:

Model >>> Tap190-G / Tap190AL-G / Tap190DLC
The Tap190-G series of AFM probes are characterized by a resonance frequency of 190kHz and have a longer cantilever compared to the TAP300 and TAP150-G AFM probes. This is required by some models of AFM systems by certain manufactureres, such as Quesant. This product is available with alignment grooves only
Technical Data:
  Value Range
Resonant Freq. 190 kHz +/-60 kHz
Force Constant 48 N/m 20 - 100 N/m
Length 225 µm +/-12 µm
Mean Width 38 µm +/-9 µm
Thickness 7 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Tap190-G, Tap190AL-G)
15nm (Tap190DLC)
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
Tap190-G AFM probe drawing
Tap190-G
Application: Soft Tapping Mode, Intermittent Contact Mode, long canitlever
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: None
Tap 190-G Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP190-G-10
Silicon AFM Probes, Tap 190, no coating
pkg/10
$200.00
Qty:
TAP190-G-50
Silicon AFM Probes, Tap 190, no coating
pkg/50
850.00
Qty:

Tap190AL-G
Application: Soft Tapping Mode, Intermittent Contact Mode, long cantilever
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Aluminum Reflex coating, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
Tap 190-G Al Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP190AL-G-10
Silicon AFM Probes, Tap 190 Al, aluminum reflex coating
pkg/10
$210.00
Qty:
TAP190AL-G-50
Silicon AFM Probes, Tap 190 Al, aluminum reflex coating
pkg/50
890.00
Qty:

Tap190DLC
Application: Soft Tapping Mode, Intermittent Contact Mode, long cantilever
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
Tap 190 DLC Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
TAP190DLC-10
Silicon AFM Probes, Tap 190 DLC, DLC coating on tip
pkg/10
$240.00
Qty:
TAP190DLC-50
Silicon AFM Probes, Tap 190 DLC, DLC coating on tip
pkg/50
1,000.00
Qty:

or go to BudgetComboBox for a mixed box of probes

Model >>> Multi75 / Multi75AL & Multi75AL-G / Multi75GD / Multi75GB / ElectriMulti75 &-G / MagneticMulti75 &-G / Multi75DLC
Technical Data:
  Value Range
Resonant Freq. 75 kHz +/-15 kHz
Force Constant 3 N/m 1 - 7 N/m
Length 225 µm +/-10 µm
Mean Width 28 µm +/-5 µm
Thickness 3 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Multi75; Multi75AL; Multi75GD; Multi75Gb)
<25nm (ElectriMulti75)
<60nm (MagneticMulti75)
<15 nm (Multi75DLC)
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
Contact Resistance 300 Ohms on platinum thin film surface
Silicon AFM Probe, Multi 75
Multi75
Application: Force Modulation, Light Tapping
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: None
Multi 75 Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
MULTI75-10
Silicon AFM Probes, Multi 75, no coating
pkg/10
$200.00
Qty:
MULTI75-50
Silicon AFM Probes, Multi 75, no coating
pkg/50
850.00
Qty:
MULTI75-W
Silicon AFM Probes, Multi 75, no coating
pkg/380
P.O.R.
Qty:

Multi75AL
Application: Force Modulation, Light Tapping
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: 30nm Al for enhanced reflectivity
Multi 75 Al Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
MULTI75AL-10
Silicon AFM Probes, Multi 75 Al, Aluminum Reflex coating
pkg/10
$210.00
Qty:
MULTI75AL-50
Silicon AFM Probes, Multi 75 Al, Aluminum Reflex coating
pkg/50
890.00
Qty:
MULTI75AL-W
Silicon AFM Probes, Multi 75 Al, Aluminum Reflex coating
pkg/380
P.O.R.
Qty:
Multi75AL with Alignment Grooves:
MULTI75AL-G-10
Silicon AFM Probes, Multi 75 Al, Aluminum Reflex coating
pkg/10
210.00
Qty:
MULTI75AL-G-50
Silicon AFM Probes, Multi 75 Al, Aluminum Reflex coating
pkg/50
890.00
Qty:
MULTI75AL-G-W
Silicon AFM Probes, Multi 75 Al, Aluminum Reflex coating
pkg/380
Call
Qty:

Multi75GD
Application: Force Modulation, Light Tapping
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on back of cantilever
Multi 75 GD Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
MULTI75GD-10
Silicon AFM Probes, Multi 75 GD, Au coated
pkg/10
$240.00
Qty:
MULTI75GD-50
Silicon AFM Probes, Multi 75 GD, Au coated
pkg/50
1,000.00
Qty:

Multi75GB
Application: Force Modulation, Light Tapping, special application
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on both sides of cantilever
BS-Multi 75 GB Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
MULTI75GB-10
Silicon AFM Probes, Multi 75 GB, overall Au coated
pkg/10
$240.00
Qty:
MULTI75GB-50
Silicon AFM Probes, Multi 75 GB, overall Au coated
pkg/50
1,000.00
Qty:

ElectriMulti75
Application: Force Modulation, Light Tapping and Electric Modes like:
• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KFM)
• Scanning Probe lithography
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.
BS-ElectriMulti 75 Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
MULTI75E-10
Silicon AFM Probes, ElectriMulti 75, overall Cr/Pt coated
pkg/10
$240.00
Qty:
MULTI75E-50
Silicon AFM Probes, ElectriMulti 75, overall Cr/Pt coated
pkg/50
1,000.00
Qty:
Multi75E with Alignment Grooves:
MULTI75E-G-10
Silicon AFM Probes, ElectriMulti 75, overall Cr/Pt coated
pkg/10
240.00
Qty:
MULTI75E-G-50
Silicon AFM Probes, ElectriMulti 75, overall Cr/Pt coated
pkg/50
1,000.00
Qty:

MagneticMulti75
Application: Magnetic Force Microscopy (MFM)
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Tip side - Magnetic
Detector side - Aluminum
MagneticMulti AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
MULTI75M-10
Silicon AFM Probes, MagneticMulti 75, Magnetic/Al coated
pkg/10
$240.00
Qty:
MULTI75M-50
Silicon AFM Probes, MagneticMulti 75, Magnetic/Al coated
pkg/50
1,000.00
Qty:
Multi75M with Alignment Grooves:
MULTI75M-G-10
Silicon AFM Probes, MagneticMulti 75, Magnetic/Al coated
pkg/10
240.00
Qty:
MULTI75M-G-50
Silicon AFM Probes, MagneticMulti 75, Magnetic/Al coated
pkg/50
1,000.00
Qty:

Multi75DLC
Application: Force Modulation Mode, Pulsed Force Mode (PFM)
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.
Multi 75 DLC Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
MULTI75DLC-10
Silicon AFM Probes, Multi 75 GB, overall Au coated
pkg/10
$240.00
Qty:
MULTI75DLC-50
Silicon AFM Probes, Multi 75 GB, overall Au coated
pkg/50
1,000.00
Qty:

or go to BudgetComboBox for a mixed box of probes

Model >>> Contact / ContAL & ContAL-G / ContGD / ContGB / ElectriCont / ContDLC
Technical Data:
  Value Range
Resonant Freq. 13 kHz +/-4 kHz
Force Constant 0.2 N/m 0.07 - 0.4 N/m
Length 450 µm +/-10 µm
Mean Width 50 µm +/-5 µm
Thickness 2 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Contact; ContAL; ContGD; ContGb)
<25nm (ElectriCont)
<15nm (ContDLC)
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
Silicon AFM Probe, Cont
Contact
Application: Contact Mode, Pulsed Force Mode (PFM)
General: Rotated Monolithic silicon probe
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: None
Cont Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
CONTACT-10
Silicon AFM Probes, Cont, no coating
pkg/10
$200.00
Qty:
CONTACT-50
Silicon AFM Probes, Cont, no coating
pkg/50
850.00
Qty:
CONTACT-W
Silicon AFM Probes, Cont, no coating
pkg/380
P.O.R.
Qty:

ContAL
Application: Contact Mode, Pulsed Force Mode (PFM)
General: Rotated Monolithic silicon probe
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: 30nm Al for enhanced reflectivity
Cont Al Silicon AFM Probe

Prod #DescriptionUnitPriceOrder / Quote
CONTAL-10
Silicon AFM Probes, Cont, Aluminum Reflex coating
pkg/10
$210.00
Qty:
CONTAL-50
Silicon AFM Probes, Cont, Aluminum Reflex coating
pkg/50
890.00
Qty:
CONTAL-W
Silicon AFM Probes, Cont, Aluminum Reflex coating
pkg/380
P.O.R.
Qty:
ContAl with Alignment Grooves:
CONTAL-G-10
Silicon AFM Probes, Cont, Aluminum Reflex coating