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budget sensors atomic force microscopy probes

Silicon AFM All-in-One & SiNi Mode Probes

Four Cantilevers ALL-IN-ONE	Soft Contact mode SiNi
Coatings: Uncoated Aluminum Reflex	Coatings: Cr/Au

Tapping Mode Probes

Force Modulation Probes

MFM Probes

Contact Mode Probes

Cantilever Tweezers

Model >>> All-In-One / All-In-One-AL

The All-In-One Series probes offer four cantilevers with different geometry for all topography measurement modes: contact mode, force modulation, soft tapping and tapping mode. The resonance frequencies and force constants are similar to the ones of the well-established models Contact, Multi75, Tap150 and Tap300 or ContAL, Multi75AL, Tap150AL and Tap300AL for the model with Aluminum Reflex coating.

Available with tip and without tip (tipless).

The long cantilevers A for contact mode and B for force modulation are located at one end of the chip, while the short cantilevers C for soft tapping and D for tapping mode are located at the opposite end. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

Technical Data: All-In-One
	Cantilever A		Cantilever B		Cantilever C		Cantilever D
Application	Contact Mode		Force modulation, Pulsed Force Mode		Soft Tapping Mode, Intermittent Contact-Mode		Tapping Mode, Intermittent Contact-Mode
	Values	Range	Values	Range	Values	Range	Values	Range
Resonant Frequency	15 kHz	+/-5 kHz	80 kHz	+/-30 kHz	150 kHz	+/-80 kHz	350 kHz	+/-150 kHz
Force Constant	0.2 N/m	0.04 - 0.7 N/m	2.7 N/m	0.4 - 10 N/m	7.4 N/m	1 - 29 N/m	40 N/m	7 - 160 N/m
Resonant Frequency and Force Constant Similar to	Contact		Multi75		Tap150-G		Tap300
Cantilever Length	500µm	+/-10µm	210µm	+/-10µm	150µm	+/-10µm	100µm	+/-10µm
Mean Width	30µm	+/-5µm	30µm	+/-5µm	30µm	+/-5µm	50µm	+/-5µm
Thickness	2.7µm	+/-1µm	2.7µm	+/-1µm	2.7µm	+/-1µm	2.7µm	+/-1µm
Tip Height	17µm	+/-2µm	17µm	+/-2µm	17µm	+/-2µm	17µm	+/-2µm
Tip Set Back	15µm	+/-5µm	15µm	+/-5µm	15µm	+/-5µm	15µm	+/-5µm
Tip Radius	< 10nm
Coating	None or Aluminum Reflex
Half Cone Angle	20° - 25° along cantilever axis, 25° - 30° from side, 10° at the apex

All-In-One: Tip radius <10nm
Application:	Several Measurement Modes
General:	Rotated Monolithic Silicon Probe Symmetric Tip Shape Chipsize: 3.4 x 1.6 x 0.3 mm
Coating:	None
Technical Data:	This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200 nm.

Prod # Description Unit Price Order / Quote

AIO-10
Silicon AFM Probes, All-In-One, no coating, with tips
pkg/10
$240.00

Qty:

AIO-50
Silicon AFM Probes, All-In-One, no coating, with tips
pkg/50
1,000.00

Qty:

AIO-TL-10
Silicon AFM Probes w/o tips, All-In-One, no coating, tipless
pkg/10
240.00

Qty:

AIO-TL-50
Silicon AFM Probes w/o tips, All-In-One, no coating, tipless
pkg/50
1,000.00

Qty:

All-In-One-AL Tip radius <10nm
Application:	Several Measurement Modes
General:	Rotated Monolithic Silicon Probe Symmetric Tip Shape Chipsize: 3.4 x 1.6 x 0.3 mm
Coating:	Aluminium reflex coating, 30 nm thick
Technical Data:	This probe uses "on scan angle" symmetric tips to provide a more symmetric representation of features over 200 nm.

Prod # Description Unit Price Order / Quote

AIOAL-10
Silicon AFM Probes, All-In-One, Aluminum Reflex coating, with tips
pkg/10
$240.00

Qty:

AIOAL-50
Silicon AFM Probes, All-In-One, Aluminum Reflex coating, with tips
pkg/50
1,000.00

Qty:

AIOAL-TL-10
Silicon AFM Probes w/o tips, All-In-One, Aluminum Reflex coating, tipless
pkg/10
240.00

Qty:

AIOAL-TL-50
Silicon AFM Probes w/o tips, All-In-One, Aluminum Reflex coating, tipless
pkg/50
1,000.00

Qty:

Silicon Nitride AFM Probes
Model >>> SiNi AFM Probes

Silicon Nitride Holder Chip

silicon nitride holder chip for afm

The Silicon Nitride Holder Chip fits most commercial AFMs as it is industry standard size. It is compatible with VEECO AFMs, TM Microscopes, JEOL, Molecular Imaging and other commercial AFMs.

Silicon Nitride Cantilever

silicon nitride cantilever

SiN (Si3N4) probes feature 4 cantilevers per chip. The cantilever's low force constants make these probes ideal for very soft contact mode imaging.

Silicon Nitride Tip

The oxide-sharpened wedge tip has two peaks per tip, a "twin tip". The protrusion at the cantilever's end is used for imaging, since the cantilever is mounted at some angle (e.g. 13 deg.) which keeps only one tip interacting with the surface if the sample is sufficiently flat. (Valleys are not greater than 400nm deep).

Tip radius:	<15nm
Application:	Soft Contact Mode
General:	4 Silicon Nitride Cantilevers (Triangular, 2 different lengths) Silicon Nitride Wedge Tip Silicon Support Chip (3.4 mm x 1.6 mm x 0.45 mm)

Cantilever lengths:	100 µm and 200 µm
Coating:	70 nm thick Chromium/Gold

Technical Data:
Values:	short cantilever	long cantilever	Range
Resonant Freq.	45 kHz	12.6 kHz	-
Force Constant	0.27 N/m	0.06 N/m	-
Lengths	100 µm	200 µm	+/-10 µm
Widths	16 µm	30 µm	+/-5 µm
Thickness	520 nm		+/-50 µm
Tip Height (Wedge Tip)	12 µm (overall) >450 nm (effective)		+/-2 µm 450-550 nm
Double Tip Spacing	4.5 µm		+/-0.5 µm
Tip Radius	<15 nm
Half Cone Angle	35° (macroscopic)
Reflex Coating	Gold/Chromium
Cantilever Bending	typically 3°, max 7°

Prod # Description Unit Price Order / Quote

SINI-30
Silicon Nitride AFM Probes, SiN, Cr/Au reflex coating
pkg/30
$379.00

Qty:

SINI-100
Silicon Nitride AFM Probes, SiN, Cr/Au reflex coating
pkg/100
1,200.00

Qty:

SINI-300
Silicon Nitride AFM Probes, SiN, Cr/Au reflex coating
pkg/300
P.O.R.

Qty:

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AFM Cantilever Tweezers, NM-SS

Easily grasp AFM cantilevers / probes with these precise, non-magnetic stainless steel. 4-5/8" (117mm) long. Although these tweezers are made from non-magnetic stainless steel, magnetization can occur in the presence of strong magnetic fields.

Prod # Description Unit Price Order / Quote

5599
AFM Cantilever Tweezers, Non-magnetic Stainless Steel
each
$12.00

Qty:

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AFM Cantilever Tweezers, Titanium

Easily grasp magnetic AFM cantilevers / probes with these precise titanium, absolutely non-magnetic tweezers. 4-5/8" (117mm) long.

Prod # Description Unit Price Order / Quote

5596-TI
AFM Cantilever Tweezers, Titanium
each
$28.50

Qty: