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BudgetSensors Overview

budget sensors atomic force microscopy probes


Silicon AFM Tapping Mode Probes


Tapping Mode
TAP 300
Soft Tapping Mode
TAP 150
Tapping Mode
TAP 190
Coatings:
Coatings:
Coatings:


Force Modulation Probes MFM Probes Contact Mode Probes
SiNi Probes All-in-One Probes Cantilever Tweezers



Model >>> Tap300-G / Tap300AL-G / Tap300GD-G / Tap300GB-G / ElectriTap300-G / Tap300DLC

Technical Data:
  Value Range
Resonant Freq. 300 kHz +/-100 kHz
Force Constant 40 N/m 20 - 75 N/m
Length 125 µm +/-10 µm
Mean Width 30 µm +/-5 µm
Thickness 4 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius

<10 nm (Tap 300; 300AL; 300GD)
<25nm (Electri-Tap 300)
<15nm (Tap300DLC)
Also see individual probes.

Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
silicon afm probe, tap300 drawing




Tap300-G Tip radius <10nm
Application: Tapping, Intermittent Contact
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
Coating: None
tap 300 silicon afm probe

Prod # Description Unit Price Order / Quote
TAP300-G-10 Silicon AFM Probes, Tap 300 -G, no coating pkg/10 $200.00
Qty:
TAP300-G-50 Silicon AFM Probes, Tap 300 -G, no coating pkg/50 850.00
Qty:
TAP300-G-W Silicon AFM Probes, Tap 300 -G, no coating pkg/380 P.O.R.
Qty:




Tap300AL-G Tip radius <10nm
Application: Tapping, Intermittent Contact
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: 30nm Al for enhanced reflectivity
tap 300 al silicon afm probe

Prod # Description Unit Price Order / Quote
TAP300AL-G-10 Silicon AFM Probes, Tap 300 AL -G, Aluminum Reflex Coating pkg/10 $210.00
Qty:
TAP300AL-G-50 Silicon AFM Probes, Tap 300 AL -G, Aluminum Reflex Coating pkg/50 890.00
Qty:
TAP300AL-G-W Silicon AFM Probes, Tap 300 AL -G, Aluminum Reflex Coating pkg/380 P.O.R.
Qty:




Tap300GD-G Tip radius <10nm
Application: Non-contact, Tapping
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on back of cantilever
tap 300 gd silicon afm probe

Prod # Description Unit Price Order / Quote
TAP300GD-G-10 Silicon AFM Probes, Tap 300 GD -G, part Au coating pkg/10 $240.00
Qty:
TAP300GD-G-50 Silicon AFM Probes, Tap 300 GD -G, part Au coating pkg/50 1000.00
Qty:




Tap300GB Tip radius <25nm
Application: Non-contact, Tapping, special application
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves or no Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: 70nm Au on both sides of cantilever
tap 300 gb silicon afm probe

Prod # Description Unit Price Order / Quote
TAP300GB-10 Silicon AFM Probes, Tap 300 GB, no grooves, overall Au coating pkg/10 $240.00
Qty:
TAP300GB-G-10 Silicon AFM Probes, Tap 300 GB, overall Au coating pkg/10 240.00
Qty:
TAP300GB-G-50 Silicon AFM Probes, Tap 300 GB, overall Au coating pkg/50 1000.00
Qty:




ElectriTap300-G Tip radius <25nm
Application: Tapping, Intermittent Contact Mode and Electric Modes like:
• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KFM)
• Scanning Probe Lithography
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.
electritap 300 silicon afm probe

Contact Resistance: 300 ohms on Pt thin film surface
Prod # Description Unit Price Order / Quote
TAP300E-G-10 Silicon AFM Probes, ElectriTap 300 -G, overall Cr/Pt Coating pkg/10 $240.00
Qty:
TAP300E-G-50 Silicon AFM Probes, ElectriTap 300 -G, overall Cr/Pt Coating pkg/50 1000.00
Qty:




TAP300DLC Tip radius <15nm
Application: Tapping, Intermittent Contact Mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.
tap300dlc silicon afm probe

Prod # Description Unit Price Order / Quote
TAP300DLC-10 Silicon AFM Probes, Tap 300 DLC, DLC coating on tip pkg/10 $240.00
Qty:
TAP300DLC-50 Silicon AFM Probes, Tap 300 DLC, DLC coating on tip pkg/50 1000.00
Qty:





go to BudgetComboBox for a mixed box of probes

Model >>> Tap150-G / Tap150Al-G / Tap150DLC

Technical Data:
  Value Range
Resonant Freq. 150 kHz +/-75 kHz
Force Constant 5 N/m 1.5 - 15 N/m
Length 125 µm +/-10 µm
Mean Width 25 µm +/-5 µm
Thickness 2.1 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Tap150-G, Tap150AL-G)
<15 nm (Tap150DLC)
Also see individual probes.
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
tap150-g afm probe drawing
Tap150-G Tip radius <10nm
Application: Soft Tapping Mode, Intermittent Contact Mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: None
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
tap 150-g silicon afm probe

Prod # Description Unit Price Order / Quote
TAP150-G-10 Silicon AFM Probes, Tap 150 -G, no coating pkg/10 $200.00
Qty:
TAP150-G-50 Silicon AFM Probes, Tap 150 -G, no coating pkg/50 850.00
Qty:




Tap150AL-G Tip radius <10nm
Application: Soft Tapping Mode, Intermittent Contact Mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Aluminum Reflex coating, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
tap 150al-g silicon afm probe

Prod # Description Unit Price Order / Quote
TAP150AL-G-10 Silicon AFM Probes, Tap 150 AL -G, aluminum reflex coating pkg/10 $210.00
Qty:
TAP150AL-G-50 Silicon AFM Probes, Tap 150 AL -G, aluminum reflex coating pkg/50 890.00
Qty:




TAP150DLC Tip radius <15nm
Application: Tapping, Intermittent Contact Mode
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm.
tap150dlc silicon afm probe

Prod # Description Unit Price Order / Quote
TAP150DLC-10 Silicon AFM Probes, Tap 300 DLC, DLC coating on tip pkg/10 $240.00
Qty:
TAP150DLC-50 Silicon AFM Probes, Tap 300 DLC, DLC coating on tip pkg/50 1000.00
Qty:
or go to BudgetComboBox for a mixed box of probes



Model >>> Tap190-G / Tap190AL-G / ElectriTap190 / Tap190DLC

The Tap190-G series of AFM probes are characterized by a resonance frequency of 190kHz and have a longer cantilever compared to the TAP300 and TAP150-G AFM probes. This is required by some models of AFM systems by certain manufactureres, such as Quesant. This product is available with alignment grooves only
Technical Data:
  Value Range
Resonant Freq. 190 kHz +/-60 kHz
Force Constant 48 N/m 20 - 100 N/m
Length 225 µm +/-12 µm
Mean Width 38 µm +/-9 µm
Thickness 7 µm +/-1 µm
Tip Height 17 µm +/-2 µm
Tip Set Back 15 µm +/-5 µm
Tip Radius <10 nm (Tap190-G, Tap190AL-G)
<25nm (ElectriTap190)
<15nm (Tap190DLC)
Also see individual probes.
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10°-at the apex
tap190-g afm probe drawing
Tap190-G Tip radius <10nm
Application: Tapping Mode, Intermittent Contact Mode, long canitlever
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: None
tap 190-g silicon afm probe

Prod # Description Unit Price Order / Quote
TAP190-G-10 Silicon AFM Probes, Tap 190 -G, no coating pkg/10 $200.00
Qty:
TAP190-G-50 Silicon AFM Probes, Tap 190 -G, no coating pkg/50 850.00
Qty:




Tap190AL-G Tip radius <10nm
Application: Tapping Mode, Intermittent Contact Mode, long cantilever
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Aluminum Reflex coating, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
tap 190-g al silicon afm probe

Prod # Description Unit Price Order / Quote
TAP190AL-G-10 Silicon AFM Probes, Tap 190 AL -G, aluminum reflex coating pkg/10 $210.00
Qty:
TAP190AL-G-50 Silicon AFM Probes, Tap 190 AL -G, aluminum reflex coating pkg/50 890.00
Qty:




ElectriTap190 Tip radius <25nm
Application: Tapping Mode, Intermittent Contact Mode and Electric Modes like:
• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KFM)
• Scanning Probe Lithography
General: Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.
electritap 190 silicon afm probe

Contact Resistance: 300 ohms on Pt thin film surface
Prod # Description Unit Price Order / Quote
TAP190E-G-10 Silicon AFM Probes, ElectriTap 190 E -G, overall Cr/Pt Coating pkg/10 $240.00
Qty:
TAP190E-G-50 Silicon AFM Probes, ElectriTap 190 E -G, overall Cr/Pt Coating pkg/50 1000.00
Qty:




Tap190DLC Tip radius <15nm
Application: Tapping Mode, Intermittent Contact Mode, long cantilever
General: Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
Coating: Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation of features over 200nm
tap 190 dlc silicon afm probe

Prod # Description Unit Price Order / Quote
TAP190DLC-10 Silicon AFM Probes, Tap 190 DLC, DLC coating on tip pkg/10 $240.00
Qty:
TAP190DLC-50 Silicon AFM Probes, Tap 190 DLC, DLC coating on tip pkg/50 1000.00
Qty:

go to BudgetComboBox for a mixed box of probes




AFM Cantilever Tweezers
close-up

AFM/STM Economy Cantilever Tweezers, Non-magnetic Stainless Steel

Metrology Probe Tweezer Cantilever Tweezers
Easily grasp AFM/STM cantilevers / probes with these precise, non-magnetic stainless steel AFM Probe Tweezers. 4-5/8" (117mm) long. Although these tweezers are made from non-magnetic stainless steel, magnetization can occur in the presence of strong magnetic fields.

Prod # Description Unit Price Order / Quote
5599 AFM/STM Cantilever Tweezers, Non-magnetic Stainless Steel each $12.00
Qty:




AFM Cantilever Tweezers
close-up

NEW AFM/STM Precision Cantilever Tweezers, Non-magnetic Stainless Steel

AFM/STM Precision Cantilever Tweezers
Precision formed, Swiss made, low carbon, non-magnetic, austenitic steel (material number 1.4435, DIN X2CrNiMo 18-14-3, AISI number 316L) for precise manipulation of cantilevers and probes. 4-3/4" (120mm). Non-magnetizable.

Prod # Description Unit Price Order / Quote
5599-P AFM/STM Precision Cantilever Tweezers, Non-magnetic Stainless Steel each $26.00
Qty:




AFM Cantilever Tweezers made from Titanium - tip view
close-up

AFM/STM Cantilever Tweezers, Titanium

AFM Cantilever Tweezers - Titanium
Easily grasp magnetic AFM/STM cantilevers / probes with these precise titanium, absolutely non-magnetic tweezers. 4-5/8" (117mm) long.

Prod # Description Unit Price Order / Quote
5596-TI AFM/STM Cantilever Tweezers, Titanium each $28.50
Qty: