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go to Carbon and Graphite Planchets
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Beryllium offers an ideal background for X-ray analysis and backscattered electron imaging using a SEM or microprobe analyzer. The low atomic number of Beryllium (4) and the high purity of the planchets virtually eliminates characteristic X-ray peaks will give a low background radiation. | |||||||||||||||||||||||||||||
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The planchets are made of Beryllium with a 99% or better purity and any of the possible
impurities will not exceed 0.08% . In fact most of the possible impurities are well
below 0.01%. Using proper cleaning and safety procedures the planchets can be used
again. Available in three sizes to fit the most widely used specimen mounts. Surface
finish is smooth: 1.6µm or less and is perfectly suitable for many applications.
Warning: Cleaning and handling of Beryllium must be done in such a way that it does not generate particulates which are toxic when inhaled. An alternative for beryllium planchets could be graphite planchets which also gives a low background and virtually no characteristic peaks other than carbon.
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