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AGILENT
ASPEX
CAMECA
COXEM
EVEX Mini-SEM
FEI
Hitachi
JEOL
Nikon
Obducat-CamScan
Orsay Physics
PHENOM WORLD
SEC
SELMI
SERON TECHNOLOGIES
SII
TESCAN
TOPCON
VISITEC
ZEISS
EDX / WDX and EM Accessories Manufacturers
Bruker AXS
EDAX
EVEX
IXRF
Oxford Instruments
Thermo
DEBEN SEM Stages
EFjeld SEM Stages
FE-Sources
Fischione Instruments
Gatan
K.E. Developments
OmniProbe
ZYVEX
Minus K Vibration Isolaton
Microwave Protocols
Microwave Protocol Site (link soon to come)
Education & Technology
Light Microscopes
SEM
TEM
TEM Sample Prep
FIB
elmiX Software Collection
AFM
Confocal Microscopy
Vacuum History, Terminology & Technology
Guide to Forensic Science Degree Programs
Microscope Societies, America
Microscopy Society of America (MSA)
Microbeam Analysis Society (MAS)
Appalachian Regional Microscopy Society (AReMS)
Capital District Microscopy & Microanalysis Society (CDMMS)
Central States Microscopy and Microanalysis Society (CSMMS)
Chesapeake Society for Microscopy (CSM)
Connecticut Microscopy Society (ConnMS)
Florida Society for Microscopy (FSM)
Indiana Microscopy Society (INMS)
Iowa Microscopy Society (IMS)
Michigan Microscopy and Microanalysis Society (MMMS)
Microscopy Society of Northeastern Ohio (MSNO)
Microscopy Society of the Ohio River Valley (MSORV)
Midwest Microscopy and Microanalysis Society (MMMS)
Minnesota Microscopy Society MMS)
New England Society for Microscopy (NESM)
New York Microscopical Society (NYMS)
New York Society of Experimental Microscopists (NYSEM)
Oklahoma Microscopy Society (OMS)
Pacific Northwest Microscopy Society (PNMS)
Southeastern Microscopy Society (SEMS)
Southern California Society for Microscopy and Microanalysis (SCSMM)
Texas Society for Microscopy (TSM)
Microscope Societies, International
Australia
Micro Beam Analysis Society (EMAS)
France
Germany
Japan
UK
Microscopy Society of America (MSA)
Independent EM Repair Businesses and Used Instruments
Cleaner Image (3rd party SEM service)
Excel Service Solutions, Inc. (AMRAY SEM service)
Quality Images (3rd party SEM service)
National SEM Service (3rd party SEM service)
Scanners Corporation (3rd party SEM service / used SEMs)
Scanservice Corporation (3rd party SEM service / used SEMs)
Secondary Image (3rd party SEM service)
SEMTech Solutions (used SEMs)
Superior Technical Services, INC. (SEM / FIB Service)
Technical Sales Solutions (used SEM / TEM / FIB)
References and Journals
Journal References to Research Work Done Using a Dosaka Microslicer
PELCO® Microwave Processor References
Microscopy Magazines
Advanced Materials & Processes
Bioscience technology
Evidence Technology
Forensic Magazine
Imaging and Microscopy
Journal of Histology
Journal of Electron Microscopy
Journal of Microscopy
Materials Characterization
Materials Today
Microscopy and Analysis
Microscopy and Microanalysis
Microscopy Today
Micron
R&D Magazine
Scanning
Ultra Microscopy
Vacuum Technology
Nanotechnology
Nanotech website
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Page Last Updated: January 9, 2012
