70nm Pitch Reference Standard for Very High Resolution Calibration for AFM, SEM, Auger and FIB.
Period: 70nm pitch nominal, one dimensional array. Accuracy is +/- 0.25nm.
Calibration certificate will give the actual pitch of the standard.
Surface structure: Silicon Dioxide ridges on Silicon, 4x3mm dimensions.
Ridge height and width are both about 35nm (not calibrated).
Usability: The calibrated pattern covers a 1.2 x 0.5mm area. There is sufficient usable area to make
thousands of measurements without reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from 100nm to 3um. Mounted on a 12mm steel AFM disk.
SEM, Auger, FIB: Can be used for a wide range of accelerating voltage (1kV-20kV) and calibrates images from 25kX to 1000kX.
Can be supplied unmounted or mounted on an SEM stub of your choice.
Certification: There is a version with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements.
There is also the traceable, certified version measured in comparison with a standard calibrated at PTB
(Physiklisch-Technischen Bundesanstalt in Braunschweig, Germany, is the German counterpart of NIST). The standard is NIST
traceable by virtue of the mutual recognition agreement by NIST and PTB.
See Mount Selections A-P
| Prod # | Description | Unit | Price | Order / Quote |
| 70nm AFM Reference Standard, Certified, Non-traceable, Mounted on disk: |
| 70nm Very High Resolution AFM Reference Standard on 12mm steel disk | | |
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| 70nm SEM, Auger and FIB Reference Standard, Certified, Non-traceable |
| 70nm Very High Resolution AFM Reference Standard, Unmounted | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount A | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount B | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount C | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount D | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount E | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount F | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount G, you supply mount | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount K | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount L | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount M | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount O | | |
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| 70nm Very High Resolution AFM Reference Standard, Mount P | | |
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| 70nm AFM Reference Standard, Certified, Traceable, Mounted on disk: |
| 70nm Very High Resolution AFM Reference Standard on 12mm steel disk | | |
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| 70nm SEM, Auger and FIB Reference Standard, Certified, Traceable |
| 70nm Very High Resolution AFM Reference Standard, Traceable, Unmounted | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount A | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount B | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount C | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount D | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount E | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount F | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount G, you supply mount | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount K | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount L | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount M | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount O | | |
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| 70nm Very High Resolution AFM Reference Standard, Traceable, Mount P | | |
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145nm Pitch Calibration Standard for AFM
Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements.
Period: 145nm pitch nominal, one dimensional array. Accuracy is +/- 1nm. Calibration certificate will give the actual pitch of the standard.
Surface structure: Aluminum lines on glass, 4x6mm dimensions. Line height (about 100nm) and line width (about 75nm) are not calibrated.
Usability: The calibrated pattern covers the entire standard. There is sufficient usable area to make tens of thousands of measurements without reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from 250nm to 10um. Available unmounted or mounted on a 12mm steel AFM disk.
Certification: Comes with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements.
See Mount Selections A-P
| Prod # | Description | Unit | Price | Order / Quote |
| 145nm AFM Reference Standard, Certified, Non-traceable, Mounted on disk: |
| 145nm Very High Resolution AFM Reference Standard on 12mm steel disk | | |
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| 145nm AFM Reference Standard, Certified, Non-traceable, Unmounted: |
| 145nm Very High Resolution AFM Reference Standard, Unmounted | | |
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292nm Pitch High Magnification, High Resolution Calibration Standard for AFM, SEM, Auger and FIB.
Precision holographic grating standard with high contrast and excellent edge definition.
Period: 292nm pitch nominal, one dimensional array. Accuracy is +/- 1%. Calibration certificate will give the actual pitch of the standard.
Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated.
Usability: The calibrated pattern covers the entire chip. There is sufficient usable area to make tens of thousands of measurements without reusing any areas contaminated or altered by previous scans.
AFM: Use in contact, tapping and other modes with image sizes from 500nm to 20um. Mounted on a 12mm steel AFM disk.
SEM, Auger, FIB: Can be used for a wide range of accelerating voltage (<1kV-30kV) and calibrates images from 5kX to 200kX. Can be supplied unmounted or mounted on an SEM stub of your choice.
Certification: There is a version with a non-traceable manufacturer’s certificate stating average pitch, based on batch measurements.
There is also the traceable, certified version measured in comparison with a standard calibrated at PTB (Physiklisch-Technischen Bundesanstalt in Braunschweig, Germany, is the German counterpart of NIST). The standard is NIST traceable by virtue of the mutual recognition agreement by NIST and PTB.
See Mount Selections A-P
| Prod # | Description | Unit | Price | Order / Quote |
| 292nm AFM Reference Standard, Certified, Non-traceable, Mounted on disk: |
| 292nm High Resolution AFM Reference Standard on 12mm steel disk | | |
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| 292nm SEM, Auger and FIB Reference Standard, Certified, Non-traceable |
| 292nm High Resolution AFM Reference Standard, Unmounted | | |
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| 292nm High Resolution AFM Reference Standard, Mount A | | |
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| 292nm High Resolution AFM Reference Standard, Mount B | | |
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| 292nm High Resolution AFM Reference Standard, Mount C | | |
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| 292nm High Resolution AFM Reference Standard, Mount D | | |
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| 292nm High Resolution AFM Reference Standard, Mount E | | |
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| 292nm High Resolution AFM Reference Standard, Mount F | | |
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| 292nm High Resolution AFM Reference Standard, Mount G, you supply mount | | |
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| 292nm High Resolution AFM Reference Standard, Mount K | | |
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| 292nm High Resolution AFM Reference Standard, Mount L | | |
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| 292nm High Resolution AFM Reference Standard, Mount M | | |
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| 292nm High Resolution AFM Reference Standard, Mount O | | |
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| 292nm High Resolution AFM Reference Standard, Mount P | | |
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| 292nm AFM Reference Standard, Certified, Traceable, Mounted on disk: |
| 292nm High Resolution AFM Reference Standard on 12mm steel disk | | |
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| 292nm SEM, Auger and FIB Reference Standard, Certified, Traceable |
| 292nm High Resolution AFM Reference Standard, Traceable, Mount A | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount B | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount C | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount D | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount E | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount F | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount G, you supply mount | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount K | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount L | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount M | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount O | | |
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| 292nm High Resolution AFM Reference Standard, Traceable, Mount P | | |
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