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Aluminum-Tungsten Dendritesmedium resolution test for Scanning Electron MicroscopyThe various spacings created by the dendritic structure give the gap test. The topographical arrangement
of dendrites leads to the gray level test. The specimen is non-magnetic, vacuum clean, has no adverse reaction
to the electron probe and requires no surface coating. It is most useful for working in the probe size range of
25 to 75nm. |
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Tin on Carbon DiscDispersion of tin spheres, the majority being within the size range of 10nm to 40nm, on a carbon substrate. Ideal for astigmatism correction and resolution determination. Recommended for SEM in the semiconductor industry where gold on carbon cannot be tolerated. This standard is available in two forms and can be attached to the surface of any kind of specimen mount - specify mount or unmounted. |
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Tin on Carbon on GridTin dispersed on the surface of a carbon substrate supported by a tabbed slot grid (slot size 0.4 x 2mm), with a use range of around 3 - 60nm. Tin spheres are easy to locate on the side of the slot. The comparative thinness of the supporting grid allows for your specimen and the tin sphere standard to be a the same level. |
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