MetroChip Microscope Calibration Target, for SEM, scanning ion, scanning probe (including AFM) and light microscopes
PELCO® CDMS Critical Dimension Magnification Standards
Critical Dimension (CD) Calibration Test Specimen
Reference Standards MRS-3, MRS-4, MRS-5
PELCO® XCS EDS Calibration Standards
EDS/WDS UHV-EL Reference Standard
Faraday Cup for Electron Beam Current Measurement
SEM Astigmatism Correction and Resolution Determination
SEM Magnification Calibration
SEM High Resolution Test Specimens, Gold on Carbon
PELCO® Nano Gold Resolution Test Specimen
SEM Medium Resolution Test Specimens
Aluminum-Tungsten Dendrites and Tin on Carbon
SEM Low Magnification Resolution Calibration Standards
SEM Demonstration Standard, Conductive and Non-conductive
Electron Flight Simulator Software, Version 3.1, X-ray analysis modeling and simulation software
Electron Flight Simulator Software, Version E, model beam scatter in your environmental or low vacuum SEM
Gunshot Residue Standard suitable as a calibration and validation sample in the field of analytical SEM investigations
High Magnification, High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB
Very High Resolution Calibration Reference and Traceable Standard for AFM, STM, Auger, FIB, and SEM
| Prod # | Description | Unit | Price | Order / Quote |
| PELCO® Astigmatism Corrector, unmounted | | |
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| PELCO® Astigmatism Corrector, Mount A | | |
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| PELCO® Astigmatism Corrector, Mount B | | |
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| PELCO® Astigmatism Corrector, Mount C | | |
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| PELCO® Astigmatism Corrector, Mount D | | |
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| PELCO® Astigmatism Corrector, Mount E | | |
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| PELCO® Astigmatism Corrector, Mount F | | |
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| PELCO® Astigmatism Corrector, Mount G, You Supply Mount | | |
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| PELCO® Astigmatism Corrector, Mount K | | |
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| PELCO® Astigmatism Corrector, Mount L | | |
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| PELCO® Astigmatism Corrector, Mount M | | |
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| PELCO® Astigmatism Corrector, Mount O | | |
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| PELCO® Astigmatism Corrector, Mount P | | |
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