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Electron micrographs of the platinum-gold back scattered electron reference specimen. S.E. image at low magnification. The platinum wires are visible due to the topographical variations across the specimen surface.  B.S.E. image at low magnification. The platinum wires are visible due to the atomic number difference between the platinum and gold. |
BSE Atomic Reference SpecimenWhen equipped with a back-scattered electron detector, an electron microscope has the capability to produce images in which the contrast is controlled by differences in atomic number across the specimen.Three reference specimens are now available that are suitable for testing the atomic number contrast performance. Each of the reference specimens consists of two high purity elements that have an atomic number difference of 1. They are in the form of a wire of the low Z element embedded in a matrix of the high Z element. The specimens are available as a single mount either 3mm or 5mm diameter or can be incorporated into a block of standards.
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Duplex Reference SpecimenAn alternative and very sensitive test is by means of an alloy with two major copper/zinc phases separated by an atomic number difference of 0.1. The light phase illustrated in the micrograph has a mean atomic number of 29.47 and the dark phase a mean atomic number of 29.37.
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