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Aperture Cleaning
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| High quality apertures, specially designed for use in scanning and transmission electron microscopes, Microprobe systems, Focused Ion beam and X-ray systems. Made with high precision drilled holes and with optimized shape to avoid scattering. The apertures are made to tight tolerances conforming original equipment manufacturers designs, pre-cleaned and individually packed. The apertures are either used as spray apertures in electron beam columns, limiting apertures or final apertures for objective lenses equipped with an aperture changer. Available in Pt/Ir (95:5%), Mo and Au (for some apertures). The The Pt:Ir apertures can be cleaned using aperture flaming or heating devices. Apertures are available for all current brands of EM system manufacturers: FEI/Philips, JEOL, Hitachi, ZEISS/LEO, Cameca, Topcon, Tescan and CamScan. We also carry aperture sizes used for brands which are no longer manufactured but still in use: ISI/ABT, Cambridge Instruments/Leica, Siemens, BalScan, ETEC/Autoscan, SEMCO/ZEISS Novascan and Nanolab. |
| 2mm O.D. x 0.1mm (thin) | Zeiss, LEO |
| 2mm O.D. x 0.6mm thickness | Cambridge, JEOL, Siemens, LEO, Cameca, Leica, Zeiss (EVO®) |
| 3mm O.D. x 0.1mm (thin) | Zeiss, LEO, Nanolab, Novascan |
| 3.04 O.D. x 0.25mm thickness | AEI, AMRAY, Cambridge S600, JEOL, FEI/Philips (ex PSEM 500), Zeiss, Electroscan, Tescan |
| 4mm O.D. x 0.2mm thickness | ISI, ABT, Topcon, Camscan |
| Gold Foil Apertures, 3mm O.D. x 0.25mm thickness | Zeiss, LEO, FEI/Philips |
 Top Hat Apertures |
Zeiss, LEO, Nanolab, Novascan |
 Strip Apertures |
Hitachi, JEOL, ISI |
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