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The complete range of accessories, consumables and lift-out grids for the Omniprobe Autoprobe 100, 200, 250 and 300 tools used on FIB and SEM/FIB systems such as FEI DualBeam, ZEISS CrossBeam® / NVision and JEOL JIB-4500. |
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There are four types of tips available for the different generations of AutoProbe systems:Tip with Ni Shank for AutoProbe 100 & 200
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| Custom probe tip design for the AutoProbe 100 & 200 systems. Nickel tube shank with a diameter of 0.508mm (0.0 20")
and a tungsten tip. Tip radius is 0.5µm with a 13° taper angle for maximum lifetime
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Standard W Probe Tips for AutoProbe 100 & 200 |
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Custom probe tips for the Autoprobe 100 and 200 systems. All Tungsten design with a tip radius of 0.5µm and a 13° taper angle for maximum life time. Shank diameter is 0.508mm (0.020"). |
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Tips for in-situ Tip Exchange for AutoProbe 300 |
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Custom probe tips for the Autoprobe 300 system for in-situ probe tip exchange systems. Tungsten tip with stainless steel shank, tip radius is 0.5µm with an 8-10° taper angle. |
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Tips for AutoProbe 250 |
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| Custom probe tips for the AutoProbe 250 systems. All tungsten design with a 0.508mm (0.020") shank diameter. Tip radius better than 0.5µm with a taper of 6° taper angle for greater precision. | |||||||||||||
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The Omniprobe lift out grids are specifically designed to accept the TEM lamella's milled out by FIB or SEM/FIB systems. Typical thickness of the grids is 25-30µm. The posts are designed for optimum access and provide a secure area for attaching (welding) the lamella(s). The Omniprobe grids fit standard TEM holders and provide a non-obscured view of the thin sections attached to the posts. |
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Short-Cut CouponsWith the AutoProbe 300 Omniprobe offers the fast Short-Cut method where the tip with the TEM lamella needs to be inserted in the Short-Cut Coupon. The half grid with swaged needle and lamella is then cut from the coupon and can be inserted in the TEM holder for further examination. The thickness of the Short-Cut Coupons is 200µm and can be used in suitable TEM holders. The Short-Cut Coupons are optimized for the ports used on the SEM/FIB System; 45° is used for FEI Systems, 26.5 is used for ZEISS and JEOL Systems. Short-Cut Coupons are either made of solid Cu or Cu coated with 1µm of Molybdenum to reduce the Cu signature in analytical applications. |
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Auto-Probe AccessoriesA number of accessories are available for assisting in FIB milled TEM lamella lift-out procedures. |
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![]() 460-306 Double TEM Grid Holder, NM-SS ![]() 460-307 Double TEM Grid Holder, Al |
Double TEM Grid HolderThe Double TEM grid holder holds two lift-out grids and has spring-loaded jaw for easy unloading. This holder has a short
standard pin style post base: ø3.2 x 4mm length (1/8" x 0.15") to accommodate thinner type stage plates used in full
wafer systems. Available with non-magnetic stainless steel or aluminum body.
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![]() 460-308 Double TEM Grid and Sample Holder, NM-SS ![]() 460-309 Double TEM Grid and Sample Holder, Al |
Double TEM Grid and Sample HolderTEM grid and sample holder for FIB and SEM/FIB (DualBeam and CrossBeam®) systems with stations for 2 TEM lift-out grids and 2 sample mounts.
This holder has a standard pin style posy base: ø3.2 x 8.1mm length (1/8" x 0.32") compatible with most standard pin stub holders.
The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter. Available with non-magnetic stainless
steel or aluminum body.
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![]() 460-312 Double TEM Grid and Single Sample Holder, NM-SS ![]() 460-313 Double TEM Grid and Single Sample Holder, Al |
Single Sample and Grid HolderSingle sample and TEM grid holder for FIB and SEM/FIB systems with stations for two TEM lift-out grids and one sample mount. This holder has a standard pin style post base: 3.2 x 8.1mm (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter.
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Single TEM Grid HolderThe single TEM grid holder holds a one TEM lift-out grid in the spring loaded jaws. This holder has a standard pin style posy
base: ø3.2 x 8.1mm length (1/8" x 0.32") compatible with most standard pin stub holders. Aluminum with steel spring.
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Single TEM Grid Sample Holder BaseThe sample holder base securely holds the single TEM grid holder under a stereomicroscope and allows for viewing from 2 angles
without focus adjustments on the microscope.
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Did you know that Omniprobe probes have the electrical capability to perform electromigration studies in the SEM? Ever wondered how to use less FIB time when performing TEM sample preparation? Interested in how people are testing nano-mechanical capability of MEMS?
Check out the tech notes and references below.