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| Home Page | Abbreviated Contents | Customer Login | Quick Order / View Order | |
|---|---|---|---|---|
| Contact Us | Search | Indexes | Finish Order | |
®
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The complete range of accessories, consumables and lift-out grids for the Omniprobe AutoProbe™ 100, 200, 250 and 300 tools used on FIB and SEM/FIB systems such as FEI DualBeam™, ZEISS CrossBeam® / NVision and JEOL JIB-4500. |
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There are four types of tips available for the different generations of AutoProbe™ systems:Tip with Ni Shank for AutoProbe™ 100 & 200
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Custom probe tip design for the AutoProbe™ 100 & 200 systems. Nickel tube
shank with a diameter of 0.508mm (0.020") and a tungsten tip. Tip radius is
0.5µm with a 13° taper angle for maximum lifetime.
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Standard W Probe Tips for AutoProbe™ 100 & 200 |
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Custom probe tips for the AutoProbe™ 100 and 200 systems. All Tungsten design with a tip radius of 0.5µm and a 13° taper angle for maximum life time. Shank diameter is 0.508mm (0.020"). |
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Tips for in situ Tip Exchange for AutoProbe™ 300 |
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Custom probe tips for the AutoProbe™ 300 system for in situ probe tip exchange systems. Tungsten tip with stainless steel shank, tip radius is 0.5µm with an 8-10° taper angle. |
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Tips for AutoProbe™ 250 |
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| Custom probe tips for the AutoProbe™ 250 systems. All-tungsten design with a 0.508mm (0.020") shank diameter. The tip radius better than 0.5µm with a taper of 6° taper angle for greater precision. | |||||||||||||
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The Omniprobe® Lift-Out Grids are specifically designed to accept the TEM lamellas milled out by FIB or SEM/FIB systems. Typical thickness of the grids is 25-30µm with a diameter of 3mm. The posts are designed for optimum access and provide a secure area for attaching (welding) the lamella(s). The Omniprobe grids fit standard TEM holders and provide a non-obscured view of the thin sections attached to the posts. |
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FIB Grid Box for Lift-Out Grids or Half GridsFour position grid box with lid for holding FIB lift-out grids or half grids. The grid box cavity depth is only 1.7mm, thus preventing the grids from rotating in the diamond shaped cavity. The FIB grids can be relatively easily loaded/unloaded using sharp tweezers.
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Short-Cut™ CouponsThe AutoProbe™ 300, Omniprobe offers the fast Short-Cut™ method where the tip with the TEM lamella needs to be inserted in the Short-Cut™ Coupon. The half grid with swaged needle and lamella is then cut from the coupon and can be inserted in the TEM holder for further examination. The thickness of the Short-Cut™ Coupons is 200µm and can be used in suitable TEM holders. The Short-Cut™ Coupons are optimized for the ports used on the SEM/FIB System; 45° is used for FEI Systems, 26.5° is used for ZEISS and JEOL Systems. Short-Cut™ Coupons are either made of solid Cu or Cu coated with 1µm of Molybdenum to reduce the Cu signature in analytical applications. |
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Auto-Probe™ AccessoriesA number of accessories are available for assisting in FIB milled TEM lamella lift-out procedures. |
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460-306 Double TEM Grid Holder, NM-SS |
Double TEM Grid HolderThe Double TEM Grid Holder holds two lift-out grids and has a spring-loaded jaw for easy unloading. This holder has a short standard pin style post base: ø3.2 x 4mm length (1/8" x 0.15") to accommodate thinner-type stage plates used in full wafer systems. Available with non-magnetic stainless steel or aluminum body. NM= non magnetic.
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460-308 Double TEM Grid and Sample Holder, NM-SS 
460-309 Double TEM Grid and Sample Holder, Al |
Double TEM Grid and Sample Holder
TEM grid and sample holder for FIB and SEM/FIB (DualBeam™ and CrossBeam®)
systems with stations for 2 TEM lift-out grids and 2 sample mounts. This holder has
a standard pin style post base: ø3.2 x 8.1mm length (1/8" x 0.32")
compatible with most standard pin stub holders. The
Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter. Available with non-magnetic stainless steel or aluminum body.
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460-312 Double TEM Grid and Single Sample Holder, NM-SS 
460-313 Double TEM Grid and Single Sample Holder, Al |
Single Sample and Grid Holder
Single sample and TEM grid holder for FIB and SEM/FIB systems with stations for two
TEM lift-out grids and one sample mount. This holder has a standard pin style post
base: 3.2 x 8.1mm (1/8" x 0.32") compatible with most standard pin stub
holders. The
Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter.
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®Did you know that Omniprobe® probes have the electrical capability to perform electromigration studies in the SEM? Ever wondered how to use less FIB time when performing TEM sample preparation? Interested in how people are testing nano-mechanical capability of MEMS?
Check out the tech notes and references below.
