Home Page Abbreviated Contents Customer Login Quick Order / View Order
Contact Us Search Indexes Finish Order

Omniprobe
Consumables and Supplies

The complete range of accessories, consumables and lift-out grids for the Omniprobe Autoprobe™ 100, 200, 250 and 300 tools used on FIB and SEM/FIB systems such as FEI DualBeam™, ZEISS CrossBeam® / NVision and JEOL JIB-4500.





Omniprobe Lift-Out Grid with 4 posts
Short-Cut™ coupons, Cu for top-side thinning
Double TEM Grid Holder, aluminum
Single TEM Grid Sample Holder

AutoProbe™ Consumables

There are four types of tips available for the different generations of AutoProbe™ systems:

Tip with Ni Shank for AutoProbe™ 100 & 200

Custom probe tip design for the AutoProbe™ 100 & 200 systems. Nickel tube shank with a diameter of 0.508mm (0.0 20") and a tungsten tip. Tip radius is 0.5µm with a 13° taper angle for maximum lifetime

Prod #DescriptionUnitPriceOrder / Quote
460-101
Tip with Ni shank for AutoProbe™ 100 & 200
pkg/10
$244.80
Qty:


Standard W Probe Tips for AutoProbe™ 100 & 200

Custom probe tips for the Autoprobe™ 100 and 200 systems. All Tungsten design with a tip radius of 0.5µm and a 13° taper angle for maximum life time. Shank diameter is 0.508mm (0.020").

Prod #DescriptionUnitPriceOrder / Quote
460-102
Standard W tip for AutoProbe™ 100 & 200
pkg/10
$93.60
Qty:


Tips for in-situ Tip Exchange for AutoProbe™ 300

Custom probe tips for the Autoprobe™ 300 system for in-situ probe tip exchange systems. Tungsten tip with stainless steel shank, tip radius is 0.5µm with an 8-10° taper angle.

Prod #DescriptionUnitPriceOrder / Quote
460-103
In-situ probe tips for AutoProbe™ 300
pkg/20
$300.00
Qty:


Tips for AutoProbe™ 250

Custom probe tips for the AutoProbe™ 250 systems. All tungsten design with a 0.508mm (0.020") shank diameter. Tip radius better than 0.5µm with a taper of 6° taper angle for greater precision.

Prod #DescriptionUnitPriceOrder / Quote
460-105
W tips for AutoProbe™ 250
pkg/10
$150.00
Qty:


Omniprobe Lift-Out Grids

The Omniprobe lift out grids are specifically designed to accept the TEM lamella's milled out by FIB or SEM/FIB systems. Typical thickness of the grids is 25-30µm. The posts are designed for optimum access and provide a secure area for attaching (welding) the lamella(s). The Omniprobe grids fit standard TEM holders and provide a non-obscured view of the thin sections attached to the posts.

Omniprobe Lift-Out Grid with 3 posts

Prod #DescriptionUnitPriceOrder / Quote
460-203
Omniprobe Lift-Out Grids, Cu with 3 posts
pkg/100
$102.00
Qty:
460-223
Omniprobe Lift-Out Grids, Mo with 3 posts
pkg/25
138.00
Qty:

Omniprobe Lift-Out Grid with 4 posts

Prod #DescriptionUnitPriceOrder / Quote
460-204
Omniprobe Lift-Out Grids, Cu with 4 posts
pkg/100
$102.00
Qty:

Omniprobe Lift-Out Grid with 5 posts

Prod #DescriptionUnitPriceOrder / Quote
460-205
Omniprobe Lift-Out Grids, Cu with 5 posts
pkg/100
$102.00
Qty:

GSB-100 storage box for 100 grids

Prod #DescriptionUnitPriceOrder / Quote
460-200
GSB-100 storage box for 100 grids, complete with base, lid and clips
each
$10.00
Qty:


Short-Cut™ Coupons

With the AutoProbe™ 300 Omniprobe offers the fast Short-Cut™ method where the tip with the TEM lamella needs to be inserted in the Short-Cut™ Coupon. The half grid with swaged needle and lamella is then cut from the coupon and can be inserted in the TEM holder for further examination. The thickness of the Short-Cut™ Coupons is 200µm and can be used in suitable TEM holders. The Short-Cut™ Coupons are optimized for the ports used on the SEM/FIB System; 45° is used for FEI Systems, 26.5 is used for ZEISS and JEOL Systems. Short-Cut™ Coupons are either made of solid Cu or Cu coated with 1µm of Molybdenum to reduce the Cu signature in analytical applications.

Short-Cut™ coupons, Cu for front-side thinning

Prod #DescriptionUnitPriceOrder / Quote
45° Front-Side Thinning
460-208
Short-Cut™ Coupons, Cu for 45° Front-Side Thinning
pkg/20
$24.00
Qty:
460-228
Short-Cut™ Coupons, Cu/Mo coated for 45° Front-Side Thinning
pkg/20
190.00
Qty:
26.5° Front-Side Thinning
460-210
Short-Cut™ Coupons, Cu for 26.5° Front-Side Thinning
pkg/20
24.00
Qty:
460-220
Short-Cut™ Coupons, Cu/Mo coated for 26.5° Front-Side Thinning
pkg/20
190.40
Qty:

Short-Cut™ coupons, Cu for back-side thinning

Prod #DescriptionUnitPriceOrder / Quote
45° Back-Side Thinning
460-209
Short-Cut™ coupons, Cu for 45° Back-Side Thinning
pkg/20
$24.00
Qty:
460-229
Short-Cut™ coupons, Cu/Mo coated for 45° Back-Side Thinning
pkg/20
190.00
Qty:
26.5° Back-Side Thinning
460-211
Short-Cut™ coupons, Cu for 26.5° Back-Side Thinning
pkg/20
24.00
Qty:
460-221
Short-Cut™ coupons, Cu/Mo coated for 26.5° Back-Side Thinning
pkg/20
190.40
Qty:


Auto-Probe™ Accessories

A number of accessories are available for assisting in FIB milled TEM lamella lift-out procedures.

TEM Grid Holder, stainless steel
460-306 Double TEM Grid Holder,
NM-SSDouble TEM Grid Holder, aluminum
460-307 Double TEM Grid Holder, Al

Double TEM Grid Holder

The Double TEM grid holder holds two lift-out grids and has spring-loaded jaw for easy unloading. This holder has a short standard pin style post base: ø3.2 x 4mm length (1/8" x 0.15") to accommodate thinner type stage plates used in full wafer systems. Available with non-magnetic stainless steel or aluminum body.

Prod #DescriptionUnitPriceOrder / Quote
460-306
Double TEM Grid Holder, NM-SS
each
$900.00
Qty:
460-307
Double TEM Grid Holder, Al
each
900.00
Qty:

TEM Grid & Sample Holder, stainless steel
460-308 Double TEM Grid and
Sample Holder, NM-SS
TEM Grid & Sample Holder, Aluminum
460-309 Double TEM Grid and
Sample Holder, Al

Double TEM Grid and Sample Holder

TEM grid and sample holder for FIB and SEM/FIB (DualBeam™ and CrossBeam®) systems with stations for 2 TEM lift-out grids and 2 sample mounts. This holder has a standard pin style posy base: ø3.2 x 8.1mm length (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter. Available with non-magnetic stainless steel or aluminum body.

Prod #DescriptionUnitPriceOrder / Quote
460-308
Double TEM Grid and Sample Holder, NM-SS
each
$1,140.00
Qty:
460-309
Double TEM Grid and Sample Holder, Al
each
1,140.00
Qty:

Single Sample & Grid Holder, non-magnetic stainless steel
460-312 Double TEM Grid and
Single Sample Holder, NM-SS
Single Sample & Grid Holder, Aluminum
460-313 Double TEM Grid and
Single Sample Holder, Al

Single Sample and Grid Holder

Single sample and TEM grid holder for FIB and SEM/FIB systems with stations for two TEM lift-out grids and one sample mount. This holder has a standard pin style post base: 3.2 x 8.1mm (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter.
Available with non-magnetic stainless steel or aluminum body.

Prod #DescriptionUnitPriceOrder / Quote
460-312
Double TEM Grid and Single Sample Holder, NM-SS
each
$1,140.00
Qty:
460-313
Double TEM Grid and Single Sample Holder, Al
each
1,140.00
Qty:

Single TEM Grid Holder

Single TEM Grid Holder

The single TEM grid holder holds a one TEM lift-out grid in the spring loaded jaws. This holder has a standard pin style posy base: ø3.2 x 8.1mm length (1/8" x 0.32") compatible with most standard pin stub holders. Aluminum with steel spring.

Prod #DescriptionUnitPriceOrder / Quote
460-310
Single TEM Grid Holder, Al
each
$440.40
Qty:

Single TEM Grid Sample Holder Base

Single TEM Grid Sample Holder Base

The sample holder base securely holds the single TEM grid holder under a stereomicroscope and allows for viewing from 2 angles without focus adjustments on the microscope.

Prod #DescriptionUnitPriceOrder / Quote
460-311
Single Grid Holder Base
each
$216.00
Qty:

Omniprobe
Tech Notes

Did you know that Omniprobe probes have the electrical capability to perform electromigration studies in the SEM? Ever wondered how to use less FIB time when performing TEM sample preparation? Interested in how people are testing nano-mechanical capability of MEMS?

Check out the tech notes and references below.

back up