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Materials Science Supplies Overview
Precision Thinning Tools Overview


NEW PELCO® Tripod Polisher™
590TEM, 590SEM, 590TS

Prepare TEM and SEM samples of pre-specified micron-sized regions



The PELCO® Tripod Polisher™ 590 was designed by researchers at the IBM East Fishkill Laboratory* to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions. For TEM samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals, and geological samples.



Features & Benefits

  • Precise cross-sectioning at the TEM level
  • Repeatable and rapid production of TEM samples
  • Reduces ion milling time to minutes as opposed to hours
  • Produces large thin areas over the entire specimen



Operation - Standard Technique

The PELCO® Tripod Polisher™ 590 can be used to prepare a sample for both SEM and TEM cross-sectional analysis. To accomplish this, the sample is mounted on the face of a special SEM stud which is clamped into the slotted L-bracket of the PELCO® Tripod Polisher™ 590. Initial grinding is done on a 15μm metal bonded diamond disc. Further lapping and polishing continues with a succession of diamond films ranging in size from 30μm to 0.5μm. The final polish is done with a colloidal silica suspension. As lapping progresses, the two rear micrometers are used to adjust the plane of polish. With periodic examinations in an inverted microscope, the plane of polish is adjusted until it is parallel to the plane of interest. At this point the SEM stud may be moved to an ion mill for a quick milling to remove fine scratches, polishing debris and to give the surface topography prior to SEM analysis. The SEM stud can be mounted directly in the SEM for analysis. When analysis is complete, a TEM sample of the same area is made. The sample is removed from the SEM stud and attached to a single aperture TEM grid. The slotted L-bracket is removed and the TEM grid is attached to the round sample mount which is affixed to the center of the polisher. The sample is now mechanically thinned using Diamond Lapping Film. During this process the sample is periodically examined in an inverted microscope and the micrometers are adjusted to maintain the correct plane of polish. The sample is FINAL polished to 1μm or less and then ion milled for up to 15 minutes.



Operation - Wedge Technique

The preferential thinning and surface topography that occurs in briefly ion milled samples makes the study of interfaces between dissimilar materials difficult. These problems can be reduced by completely eliminating the ion milling step and mechanically polishing the sample to electron transparency by employing the wedge technique. With this technique the SEM stud is replaced, in the slotted L-bracket, with a Pyrex® insert. The sample is mounted on the face of this insert. After the plane of interest is obtained, the sample is removed and mounted on the bottom of the Pyrex® insert. The two rear micrometers are adjusted and the micrometer nearest the sample is retracted to produce a wedge shape as material is removed from the sample. The sample, with the features of interest at the apex of the wedge, is thinned from the back side until the edge of interest is ~1μm thick. The sample is then polished on a final polishing cloth such as our MultiTex Cloth (product number 816-12) with a colloidal silica suspension until thickness fringes are visible (below a few thousand angstroms). The sample is then removed from the Pyrex® insert and attached to a single aperture TEM grid for analysis.



Ordering Information

Prod # Description Unit Price Order / Quote
59100 NEW PELCO® Tripod Polisher™ 590TEM precision sample thinning for TEM each $1380.00
Qty:
Includes: Base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590TEM accessories listed in below table

Prod # Description Unit Price Order / Quote
59200 NEW PELCO® Tripod Polisher™ 590SEM precision sample preparation for SEM each $1034.00
Qty:
Includes: Base with 2 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590SEM accessories listed in below table

Prod # Description Unit Price Order / Quote
59300 NEW PELCO® Tripod Polisher™ 590TS configured for SEM and TEM sample preparation each $1716.00
Qty:
Includes: Base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case, 590TS accessories listed in below table




Included Accessories per Kit

Accessories PELCO® Tripod Polisher™
590TEM
Prod. No. 59100
PELCO® Tripod Polisher™
590SEM
Prod. No. 59200
PELCO® Tripod Polisher™
590TS
Prod. No. 59300
59306 Wedge Polishing Mount 1 - 1
59307 Slotted L-bracket 1 1 1
59308 Pyrex® Wedge Polishing Stub 1 - 1
59310 Pyrex® Insert Large 1 - 1
59312 Heater Block 1 - 1
59313 SEM Stub - 4 4
59314 Glass Leveling Slide 2 2 2
59315 Microscope Stand 1 1 1
59316 Delrin® Foot for Micrometer 3 2 3



Replacement Accessories

59306

Prod # Description Unit Price Order / Quote
59306 Wedge Polishing Mount, includes one 59311 Wedge Polishing Clamp and five 59309 Pyrex® Wedge Polishing Rods each $145.00
Qty:
59307

Prod # Description Unit Price Order / Quote
59307 Slotted L-bracket, used with 59311 Wedge Polishing Clamp and 59313 SEM Stub each $185.00
Qty:
59308

Prod # Description Unit Price Order / Quote
59308 Pyrex® Wedge Polishing Stub, used with 59311 Wedge Polishing Clamp each $17.00
Qty:
59310

Prod # Description Unit Price Order / Quote
59310 Pyrex® Insert Large, used with 59307 Slotted L-bracket each $20.00
Qty:
59312

Prod # Description Unit Price Order / Quote
59312 Heater Block, used with 59307 Slotted L-bracket each $65.00
Qty:
59313

Prod # Description Unit Price Order / Quote
59313 SEM Stub, used with 59307 Slotted L-bracket each $65.00
Qty:
59314

Prod # Description Unit Price Order / Quote
59314 Glass Leveling Slide each $6.00
Qty:
59315

Prod # Description Unit Price Order / Quote
59315 Microscope Stand each $65.00
Qty:
59316

Prod # Description Unit Price Order / Quote
59316 Delrin® Foot for Micrometer Assembly each $19.00
Qty:



Optional Accessories

59301

Prod # Description Unit Price Order / Quote
59301 Parallel Polishing Mount with Pyrex® Insert, used with basic tripod base each $72.00
Qty:
59302

Prod # Description Unit Price Order / Quote
59302 Parallel Polishing Mount 1.25" dia. Stainless Steel, used with basic tripod base each $41.00
Qty:
59303

Prod # Description Unit Price Order / Quote
59303 Planarizing Tool, for feet resurfacing each $226.00
Qty:
59304

Prod # Description Unit Price Order / Quote
59304 X-Section L-bracket Assembly each $155.00
Qty:
59309

Prod # Description Unit Price Order / Quote
59309 Pyrex® Wedge Polishing Rod, used with 59311 Wedge Polishing Clamp each $24.00
Qty:
59311

Prod # Description Unit Price Order / Quote
59311 Wedge Polishing Clamp, used with 59307 Slotted L-bracket each $53.00
Qty:


PELCO® Tripod Polisher™ 590 Starter Kit

Prod # Description Unit Price Order / Quote
59350 NEW PELCO® Tripod Polisher™ 590 Starter Kit each $695.00
Qty:
Includes one each of the items listed below:
814-457 30μm Diamond Film, 8", PB each 39.00
Qty:
814-456 15μm Diamond Film, 8", PB each 30.00
Qty:
814-454 6μm Diamond Film, 8", PB each 30.00
Qty:
814-452 1μm Diamond Film, 8", PB each 30.00
Qty:
814-451 0.5μm Diamond Film, 8", PB each 30.00
Qty:
816-12 MultiTex Cloth, 8", PSA, pkg/10 each 191.00
Qty:
59317 Glass Plate, 8" x 0.25" each 55.00
Qty:
815-120 0.05μm Colloidal Silica, 160z. each 34.00
Qty:
892-45 Mounting Wax, 135 each 5.00
Qty:
1GC450 Slotted TEM Grids, pkg/100 each 54.00
Qty:
17395 Sample Cleaner, 4oz. each 7.00
Qty:
80915 Cotton Swabs, pkg/50 each 5.00
Qty:
14005 Petri Dish each 15.00
Qty:
14012 Filter Paper each 20.00
Qty:
5398 Tweezer Set each 94.00
Qty:
80932 3M™ Scotch™ Pad each 5.00
Qty:
81450 Squeegee each 9.00
Qty:



* J. Benedict, R. Anderson, S. Klepeis, M. Chaker, in Specimen Preparation for Transmission Electron Microscopy
of Materials-II, ed. Anderson, R., Mater. Res. Soc. Proc. 199, Pittsburgh, PA USA p. 189 (1990).