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Calibration Overview
UHV-EL Reference Elements

X-Ray References
Calibration for Scanning Electron Microscopy

PELCO X-CHECKER™ | PELCO X-CHECKER™ B | PELCO X-CHECKER™ EXTRA

x-checker for scanning electron microscopy
#602

x-checker for scanning electron microscopy
NEW #602-A

PELCO X-CHECKER™

Monitor Energy Dispersive Spectrometer/SEM Systems

PELCO X-Checker™ is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. PELCO X-Checker™ contains a series of standard materials on your choice of aluminum mount. With PELCO X-Checker™, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software. When was the last time you checked the performance of your EDS system?

The #602 and #602-A contain:

  • Manganese to measure full width at half max (FWHM) detector resolution
  • Aluminum and copper to check spectral calibration
  • Carbon to monitor calibration at the low end of the spectrum for thin window detectors.
  • Nickel TEM grid sizes, 40 x 40µm and 18 x 18µm, with ±5% accuracy, are furnished for checking image analysis software calibration. They also facilitate an easy test for monitoring the amount of vacuum pump oil contamination on the detector window

Instruction booklet and storage case included.

16150 drawing 16150
16150

Prod # Description Unit Price Order / Quote
602 PELCO X-CHECKER™: Mn, Cu, C, 400 and 1000 mesh Ni grids, ø25 x 5mm cylinder mount each $600.00
Qty:
dimensions 1 sem pin mount
16111

Prod # Description Unit Price Order / Quote
602-A NEW PELCO X-CHECKER™: Mn, Cu, C, 400 and 1000 mesh Ni grids, ø12.7mm Al stub each $600.00
Qty:




x-checker for scanning electron microscopy
#602-2

x-checker for scanning electron microscopy
NEW #602-2A

PELCO X-CHECKER™ B

The addition of boron nitride to the PELCO X-Checkerâ„¢ B, #602-2 and #602-2A provides a more sensitive monitor of low end performance on thin window and windowless detectors.

16150 drawing 16150
16150

Prod # Description Unit Price Order / Quote
602-2 PELCO X-CHECKER™ B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, ø25 x 5mm cylinder mount each $700.00
Qty:
dimensions 1 sem pin mount
16111

Prod # Description Unit Price Order / Quote
602-2A NEW PELCO X-CHECKERâ„¢ B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, ø12.7mm Al stub each $700.00
Qty:




x-checker for scanning electron microscopy
#602-3

x-checker for scanning electron microscopy
NEW #602-3A

PELCO X-CHECKER™ EXTRA

EDS performance monitor contains the same elements as the #602-2 and #602-2A plus a fluorine source to test resolution at the fluorine K-alpha peak (industry standard for measuring low end resolution). A beryllium half grid is also added for ultimate test of low end detector performance.

MSDS (134KB PDF)
16150 drawing 16150
16150

Prod # Description Unit Price Order / Quote
602-3 PELCO X-CHECKER™ EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and 1,000 mesh Be grid, ø25 x 5mm cylinder mount each $800.00
Qty:
dimensions 1 sem pin mount
16111

Prod # Description Unit Price Order / Quote
602-3A NEW PELCO X-CHECKERâ„¢ EXTRA: Mn, Cu, C, BN, F, 400 mesh Ni grid and 1,000 mesh Be grid, ø12.7mm Al stub each $800.00
Qty: