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Critical Dimension (CD) Calibration Test Specimen
Reference Standards MRS-3, MRS-4, MRS-5
EDS/WDS UHV-EL Reference Standard
Faraday Cup for Electron Beam Current Measurement
SEM Astigmatism Correction and Resolution Determination
SEM Magnification CalibrationSEM High Resolution Test Specimens, Gold on Carbon
SEM Medium Resolution Test Specimens
Aluminum-Tungsten Dendrites and Tin on CarbonSEM Low Magnification Resolution Calibration Standards
Highly Oriented Pyrolytic Graphite, Super High Resolution Standard, can be used for SEM
MetroChip Microscope Calibration Target, for SEM, scanning ion, scanning probe (including AFM) and light microscopes
Electron Flight Simulator Software, Version 3.1, X-ray analysis modeling and simulation software
Electron Flight Simulator Software, Version E, model beam scatter in your environmental or low vacuum SEM
Gunshot Residue Standard suitable as a calibration and validation sample in the field of analytical SEM investigations
Very High Resolution Calibration Reference and Traceable Standard for AFM, STM, Auger, FIB, and SEM
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PELCO® Astigmatism CorrectorClear, sharp, high contrast images easy to stigmate and use for checking resolution.Sharp-edged gold particles on 1000 mesh grids attached to any specimen mount of the group listed below. This specimen is used to:
See drawings to identify specimen mount and the correct ordering number.
The specimen may also be prepared on a custom mount of your choice. PELCO® Technical Notes, PELCO® Gold SEM Astigmatism Corrector, 640 (PDF File)
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