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SEM Magnification Calibration

Scanning Electron Microscopy Test Specimens

Critical Dimension (CD) Calibration Test Specimen
MetroChip Microscope Calibration Standard
MRS-3 Reference Standard
MRS-4 Magnification Standard and Stage Micrometer
MRS-5 Magnification Reference Standard
New SEM Calibration Specimens QUANTIFOIL®
High Magnification, High Resolution Calibration Reference and Traceable Standard for SEM, AFM, Auger, and FIB


Low-Mag Calibration Ruler - Grating Replica, Waffle
Agar Copper Mesh - Silicon Test Specimen

Low-Mag Calibration Ruler

100 markings, divisions 0.01mm on disc

Prod #DescriptionUnitQtyPriceOrder / Quote
630
Lo-mag Calibration Disc, Special Mount
each
1-9
$33.00
Qty:
10+
29.70

Prod #DescriptionUnitPriceOrder / Quote
630-A
Lo-mag Calibration Disc, Mount A
each
$35.00
Qty:
630-B
Lo-mag Calibration Disc, Mount B
each
35.00
Qty:
630-C
Lo-mag Calibration Disc, Mount C
each
35.00
Qty:
630-D
Lo-mag Calibration Disc, Mount D
each
35.00
Qty:
630-E
Lo-mag Calibration Disc, Mount E
each
35.00
Qty:
630-G
Lo-mag Calibration Disc, You Supply Mount
each
133.00
Qty:
630-K
Lo-mag Calibration Disc, Mount K
each
35.00
Qty:
630-L
Lo-mag Calibration Disc, Mount L
each
35.00
Qty:
630-M
Lo-mag Calibration Disc, Mount M
each
35.00
Qty:
630-O
Lo-mag Calibration Disc, Mount O
each
35.00
Qty:
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waffle grating replica

Grating Replica, Waffle

(Crossed-Lines)

Shadowcast carbon and/or silicon monoxide prepared on a mount of your choice and carefully packaged. 2,160 lines per millimeter. See our number 252 Magnification Calibration slide-rule for quick assistance in obtaining magnification based on space counts of this product. Please specify the mount of your choice. "604" is used for special orders, or unlisted mounts. see information on mounts

PELCO® Technical Notes, SEM Magnification Calibration Diffraction Grating Replica (PDF 712KB)

Prod #DescriptionUnitPriceOrder / Quote
604
SEM Grating Replica, Unmounted
each
$41.50
Qty:
604-A
SEM Grating Replica, Mount A
each
43.50
Qty:
604-B
SEM Grating Replica, Mount B
each
43.50
Qty:
604-C
SEM Grating Replica, Mount C
each
43.50
Qty:
604-D
SEM Grating Replica, Mount D
each
43.50
Qty:
604-E
SEM Grating Replica, Mount E
each
43.50
Qty:
604-G
SEM Grating Replica, You Supply Mount
each
140.00
Qty:
604-K
SEM Grating Replica, Mount K
each
43.50
Qty:
604-L
SEM Grating Replica, Mount L
each
43.50
Qty:
604-M
SEM Grating Replica, Mount M
each
43.50
Qty:
604-O
SEM Grating Replica, Mount O
each
43.50
Qty:
604-P
SEM Grating Replica, Mount P
each
43.50
Qty:

agar copper mesh grids

Agar Copper Mesh on Folding Grids (unmounted)

For scanning electron microscopes and the low magnification range of transmission electron microscopes. The mesh is held within a folding grid.
see information on mounts

Prod #DescriptionUnitPriceOrder / Quote
631-A, 1000 mesh has a 50% open area, pitch 25µm, hole 19µm, bar 7 µm.
631-A
Agar 1000 mesh on 3mm Folding Grid
each
$29.20
Qty:
631-C, 2000 mesh has a 36% open area, pitch 12.5µm, hole 7.5µm, bar 5 µm.
631-C
Agar 2000 mesh on 3mm Folding Grid
each
29.20
Qty:

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silicon test specimen

Silicon Test Specimen

magnification calibration image distortion check; SEM, LM

Single crystal silicon, 5mm x 5mm. The squares repeat every 10µm (0.01mm). The dividing lines are about 1.9µm wide, formed by electron beam lithography. A broader marking line is written every 500µm (0.5mm) which is useful for light microscopy. Lines and squares are etched, approximately 2µm wide x 200nm deep. see information on mounts

Many types of samples can be mounted directly onto the Silicon Test Specimen so that an internal calibration is obtained on the micrograph.

A certificate of calibration can be supplied for the Silicon Test Specimen at extra cost. The guaranteed accuracy is 1%. The basic reference specimen is calibrated by the National Physical Laboratory, of England, by laser beam interferometry.
PELCO® Technical Notes, Planotec Test Specimen (pdf)

Prod #DescriptionUnitQtyPriceOrder / Quote
615
Planotec Silicon test specimen, unmounted
each
1-9
$79.45
Qty:
10+
66.80

Prod #DescriptionUnitPriceOrder / Quote
615-A
Planotec Silicon test specimen, Mount A
each
$98.80
Qty:
615-B
Planotec Silicon test specimen, Mount B
each
98.80
Qty:
615-C
Planotec Silicon test specimen, Mount C
each
98.80
Qty:
615-D
Planotec Silicon test specimen, Mount D
each
98.80
Qty:
615-E
Planotec Silicon test specimen, Mount E
each
98.80
Qty:
615-G
Planotec Silicon test specimen, you supply mount
each
198.80
Qty:
615-K
Planotec Silicon test specimen, Mount K
each
98.80
Qty:
615-L
Planotec Silicon test specimen, Mount L
each
98.80
Qty:
615-M
Planotec Silicon test specimen, Mount M
each
98.80
Qty:
615-O
Planotec Silicon test specimen, Mount O
each
98.80
Qty:
615-P
Planotec Silicon test specimen, Mount P
each
98.80
Qty:
615-5
Planotec test specimen for incident light microscopy, mounted on a blackened glass slide
each
118.35
Qty:

Planotec Silicon Test Specimens with calibration certificate for mounted test specimens only

Prod #DescriptionUnitPriceOrder / Quote
660-615-A
Planotec Silicon test specimen, certified, Mount A
each
$438.50
Qty:
660-615-B
Planotec Silicon test specimen, certified, Mount B
each
438.50
Qty:
660-615-C
Planotec Silicon test specimen, certified, Mount C
each
438.50
Qty:
660-615-D
Planotec Silicon test specimen, certified, Mount D
each
438.50
Qty:
660-615-E
Planotec Silicon test specimen, certified, Mount E
each
438.50
Qty:
660-615-G
Planotec Silicon test specimen, certified, you supply mount
each
569.50
Qty:
660-615-K
Planotec Silicon test specimen, certified, Mount K
each
438.50
Qty:
660-615-L
Planotec Silicon test specimen, certified, Mount L
each
438.50
Qty:
660-615-M
Planotec Silicon test specimen, certified, Mount M
each
438.50
Qty:
660-615-O
Planotec Silicon test specimen, certified, Mount O
each
438.50
Qty:
660-615-P
Planotec Silicon test specimen, certified, Mount P
each
438.50
Qty:
660-615-5
Planotec test specimen for incident light microscopy, certified, mounted on a blackened glass slide
each
454.50
Qty:

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