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![]() Block Test Gratings for Z-axis |
![]() Triangular Test Grating for X- or Y-axis |
![]() Test Grating for Tip Sharpness |
![]() Test Grating for Lateral Calibration |
![]() Test Grating for X-, Y- and Z-direction |
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Block Test Gratings for Z-axisSelection of 3 block type test gratings with different step heights intended for Z-axis calibration of scanning probe microscopes and linearity measurements. |
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Triangular Test Grating for X- or Y-axisThe TGT-1500 test grating is intended for SPM calibration in X- or Y-axis, determination of lateral and vertical scanner nonlinearity, detection of angular distortion and tip characterization. |
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Test Grating for Tip SharpnessThe TGTZ-400 test grating is intended for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. |
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Test Grating for Lateral CalibrationThe TG3D-3000/600 test grating with its 3-Dimensional array is intended for lateral calibration of SPM scanners, detection of lateral nonlinearity, hysteresis, creep, cross-coupling effects and for determination of the tip aspect ratio. |
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Test Grating for X-, Y- and Z-directionThe TG3D-3000/20 test grating with its truly 3-Dimensional structure is intended for simultaneous calibration in X-, Y- and Z-direction, lateral calibration of SPM scanners and detection of any lateral nonlinearity, hysteresis, creep and cross-coupling effects. |
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Si-STEP Calibration SampleThe Si-STEP silicon test sample with echeloned pattern for AFM applications is designed on the base of a silicon (111) surface with verified distribution of monoatomic steps for height calibration in angstrom and single nanometer intervals. The Si-STEP calibration sample can also be used as a flat sample substrate for nanoparticles. |
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