Electron Flight Simulator is a software tool designed to make
your job easier. It can help you understand difficult samples,
show the best way to run an analysis, and explain your results
to others. With it you can see how the beam penetrates your sample,
and where the X-ray signal comes from, for a wide variety of
microscope conditions. You can model multiple layers, particles,
defects, inclusions, and cross sections. Any sample chemistry
can be modeled.
Key Benefits:
- Eliminates guesswork
- Lets you fine tune your analysis conditions
Gives you more accurate results
Examples:
- Example 1 shows a particle on
a 3-layer substrate sample, electrons and x-rays are modeled
- Example 2 is a bulk sample showing
the electron trajectories, and generated and emitted x-rays overlaid
on each other
- Example 3 is a cross section view
of a 5-layer semiconductor sample
- Example 4 shows an inclusion in
a steel sample
- Example 5 shows a spectrum of
stainless steel generated with Spectrum Simulator
- Example 6 shows the effect of
high tilt angle on the shape of the interaction volume
- Example 7 shows the electron trajectories
in multi-color mode where each color change shows a 10% drop
in energy
| Prod # | Description | Unit | Price | Order / Quote |
|---|
| Electron Flight Simulator 3.1 | | |
|
Privacy Policy |
Copyright © 1996-2009 Ted Pella, Inc.,
All rights reserved.
All
trademarks are the property of their respective owners.
Page Last Updated: December 19, 2008
